HCF4093M013TR ,QUAD 2-INPUT NAND SCHMIDT TRIGGERSHCF4093BQUAD 2 INPUT NAND SCHMITT TRIGGER ■ SCHMITT TRIGGER ACTION ON EACH INPUT WITH NO EXTERNAL ..
HCF4094 ,8-STAGE SHIFT-AND-STORE BUS REGISTERHCF4094B8 STAGE SHIFT AND STORE BUS REGISTERWITH 3-STATE OUTPUTS
HCF4093BEY-HCF4093BM1-HCF4093M013TR
QUAD 2-INPUT NAND SCHMIDT TRIGGERS
1/7September 2001 SCHMITT TRIGGER ACTION ON EACH
INPUT WITH NO EXTERNAL COMPONENTS HYSTERESIS VOLTAGE TYPICALLY 0.9V at DD = 5V AND 2.3V at VDD = 10V NOISE IMMUNITY GREATER THAN 50%OF DD (Typ.) NO LIMIT ON INPUT RISE AND FALL TIMES QUIESCENT CURRENT SPECIFIED UP TO
20V STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT I = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC
JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTIONThe HCF4093B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4093B type consists of four schmitt
trigger circuits. Each circuit functions as a two
input NAND gate with schmitt trigger action on
both inputs. The gate switches at different points
for positive and negative going signals. The
difference between the positive voltage (VP) and
the negative voltage (VN ) is defined as hysteresis
voltage (VH).
HCF4093BQUAD 2 INPUT NAND SCHMITT TRIGGER
PIN CONNECTION
ORDER CODES
HCF4093B2/7
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF4093B3/7
DC SPECIFICATIONS The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
a : Input on terminals 1, 5, 8, 12 or 2, 6, 9, 13; other inputs to VDD.
b : Input on terminals 1 and 2, 5 and 6, 8 and 9, or 12 and 13; other inputs to VDD.
HCF4093B4/7
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200KΩ
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
