HCF4078BM1 ,8-INPUT NOR/OR GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4081 ,DUAL 4 INPUT AND GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4081 ,DUAL 4 INPUT AND GATEHCF4081BQUAD 2 INPUT AND GATE
HCF4078BM1
8-INPUT NOR/OR GATE
1/7September 2002 PROPAGATION DELAY TIME :
tPD = 75ns (TYP.) at VDD = 10V QUIESCENT CURRENT SPECIFIED UP TO
20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT
II = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC
JESD13B "STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTIONHCF4078B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
HCF4078B QUAD 2 INPUT NOR/OR GATE
provides the system designer with direct
implementation of the positive logic 8-input NOR
and OR function and supplement the existing
family of CMOS gates.
HCF4078B8 INPUT NOR/OR GATE
PIN CONNECTION
ORDER CODES
HCF4078B2/7
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF4078B3/7
DC SPECIFICATIONS The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
HCF4078B4/7
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200KΩ
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
