HCF4077BM1 ,QUAD EXCLUSIVE NOR GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4078 ,8-INPUT NOR/OR GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4078BM1 ,8-INPUT NOR/OR GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4081 ,DUAL 4 INPUT AND GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4081 ,DUAL 4 INPUT AND GATEHCF4081BQUAD 2 INPUT AND GATE
HCF4077BM1
QUAD EXCLUSIVE NOR GATE
1/7September 2001 MEDIUM-SPEED OPERATION
tPHL = tPLH = 65ns (Typ.) at CL = 50 pF and
VDD = 10V QUIESCENT CURRENT SPECIFIED UP TO
20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT
II = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC
JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTIONThe HCF4077B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4077B contains four independent
exclusive NOR gates. This device provides the
system designer with a means for direct
implementation of the exclusive-NOR. For
applications as logical comparators, adders/
subtractors, parity generator and checkers.
HCF4077BQUAD EXCLUSIVE NOR GATE
PIN CONNECTION
ORDER CODES
HCF4077B2/7
INPUT EQUIVALENT CIRCUIT
LOGIC DIAGRAM
PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF4077B3/7
DC SPECIFICATIONS The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
HCF4077B4/7
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200KΩ
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
