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HCF4021BF
8-STAGE STATIC SHIFT REGISTERS
HCC/HCF4014B
HCC/HCF40 21B
8-STAGE STATIC SHIFT REGISTERS
DESCRIPTION MEDIUM-SPEED OPERATION-12MHz (typ.)
CLOCK RATE AT VDD –VSS= 10V. FULLY STATIC OPERATION.8 MASTER-SLAVE FLIP-FLOPS PLUS OUT-
PUT BUFFERING AND CONTROL GATING. QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE. 5V, 10V AND 15V PARAMETRIC RATINGS. INPUT CURRENT OF 100nA AT 18V AND 25°C
FOR HCC DEVICE. 100% TESTED FOR QUIESCENT CURRENT. MEETS ALLREQUIREMENTS OF JEDECTEN-
TATIVE STANDARD No 13A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
November1996
TheHCC4014B, HCC4021B (extended temperatu- range) and theHCF4014B, HCF4021B (interme-
diate temperature range) are monolithic integrated
circuits,availablein 16-lead dual in-line plasticor ce-
ramic package and plastic micro package. The
HCC/HCF4014B and HCC/HCF4021B series types
are 8-stage parallel-or serial-input/serial-output re-
gisters having common CLOCK and PARAL-
LEL/SERIAL CONTROL inputs,a single SERIAL
data input, and individual parallel ”JAM” inputsto
each register stage. Each register stageisaD type,
master-slave flip-flopin additiontoan output from
stage8, ”Q” outputs are also available from stages and7. Parallelas wellas serial entryis made into
the register synchronously with the positive clockli- transition in the HCC/HCF4014B. In the
HCC/HCF4021B serial entryis synchronous with
the clock but parallel entryis asynchronous.In both
types,entryis controlled bythe PARALLEL/SERIAL
CONTROL input. When the PARALLEL/SE RIAL
CONTROL inputis low, datais serially shifted into
the 8-stage register synchronously with the positive
transition of the clock line. When the PARAL-
LEL/SERIAL CONTROL inputis high, datais jam-
med into the 8-stage register via the parallel input
(Plastic Package)
(Ceramic Package)
(Plastic ChipCarrier)
ORDERCODES:
HCC40XXBF HCF40XXBM1
HCF40XXBEY HCF40XXBC1
PIN CONNECTIONS
4014B SYNCHRONOUS PARALLEL OR
SERIAL INPUT/SERIAL OUTPUT
4021B ASYNCHRONOUS PARALLEL
INPUT OR SYNCHRONOUS
SERIAL INPUT/SERIAL OUTPUT
lines and synchronous with the positive transitionof
the clock line.In the HCC/HCF4021B, the CLOCK
inputof theinternal stageis ”forced” whenasynchro-
nous parallel entryis made. Register expansion
using multiple packageis permitted.
(MicroPackage)
1/13
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
VDD* Supply Voltage: HCC Types
HCF Types 0.5to+20 0.5to+18 Input Voltage – 0.5to VDD+ 0.5 V DC Input Current (any one input) ±10 mA
Ptot Total Power Dissipation (per package)
Dissipation per Output Transistor
for Top= Full Package-temperature Range
Top Operating Temperature: HCC Types
HCF Types
–55to+ 125
–40to+85stg Storage Temperature –65to+ 150 °C
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
VDD Supply Voltage: HCC Types
HCF Types
3to18
3to15 Input Voltage 0to VDD V
Top Operating Temperature: HCC Types
HCF Types55to+ 125
–40to+85
Stresses above thoselisted under ”Absolute MaximumRatings”may cause permanent damagetothe device. Thisisa stress rating onlyand
functionaloperation ofthe deviceattheseor anyother conditions above those indicated inthe operational sectionsof thisspecificationisnot
implied.Exposure toabsolute maximum ratingconditions forexternal periods may affect device reliability. Allvoltage values arereferredtoVSS pinvoltage.
HCC/HCF4014B/4021B
2/13
LOGIC DIAGRAMS
4014B
4021B
HCC/HCF4014B/4021B
3/13
TRUTH TABLES
HCC/HCF 4014B Serial
Input
Parallel/
Serial
Control
Pl–1 Pl–n Q1
(internal) Qn/– X1 0 0 0 0/– X1 1 0 1 0/– X1 0 1 0 1/– X1 1 1 1 1/– 00 X X 0 Qn–1/– 10 X X 1 Qn–1\– XX X X Q1 Qn
HCC/HCF4021B Serial
Input
Parallel/
Serial
Control
Pl–1 Pl–n Q1
(internal) Qn 1 0 0 0 0 1 0 1 0 1 1 1 0 1 0 1 1 1 1 1/– 0
Qn–1
Qn–1\– X0 X X Q1 Qn= don’t care case. =no change. =don’t care case. =nochange.
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions Value VO |IO|VDD TLow* 25°CTHigh*Symbol Parameter
(V) (V) (μA) (V) Min. Max. Min. Typ. Max. Min. Max.
Unit Quiescent
Current HCC
Types5 5 5 0.04 5 150
0/10 10 10 0.04 10 300
0/15 15 20 0.04 20 600
0/20 20 100 0.08 100 3000
HCF
Types5 5 20 0.04 20 150
0/10 10 40 0.04 40 300
0/15 15 80 0.04 80 600
VOH Output High
Voltage5 <1 5 4.95 4.95 4.950/10 <1 10 9.95 9.95 9.95
0/15 <1 15 14.95 14.95 14.95
VOL Output Low
Voltage
5/0 <1 5 0.05 0.05 0.0510/0 <1 10 0.05 0.05 0.05
15/0 <1 15 0.05 0.05 0.05
VIH Input High
Voltage
0.5/4.5 <1 5 3.5 3.5 3.51/9 <1 10 7 7 7
1.5/13.5<1 15 11 11 11
VIL Input Low
Voltage
4.5/0.5 <1 5 1.5 1.5 1.59/1 <1 10 3 3 3
13.5/1.5<1 15 4 4 4
*TLow =–55°Cfor HCC device:– 40°Cfor HCF device.
*THigh=+ 125°C forHCCdevice:+ 85°C forHCF device.
The NoiseMarginfor both”1” and”0” levelis:1V min.withVDD= 5V,2V min.withVDD= 10V,2.5V min.withVDD= 15V.
HCC/HCF4014B/4021B
4/13
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions Value VO |IO|VDD TLow* 25°CTHigh*Symbol Parameter
(V) (V) (μA) (V) Min. Max. Min. Typ. Max. Min. Max.
Unit
IOH Output
Drive
Current HCC
Types5 2.5 5 –2 – 1.6– 3.2 – 1.155 4.6 5 – 0.64 – 0.51–1 – 0.36
0/10 9.5 10 – 1.6 – 1.3– 2.6 – 0.9
0/15 13.5 15 – 4.2 – 3.4– 6.8 – 2.4
HCF
Types5 2.5 5 – 1.53 – 1.36– 3.2 – 1.15 4.6 5 – 0.52 – 0.44–1 – 0.36
0/10 9.5 10 – 1.3 – 1.1– 2.6 – 0.9
0/15 13.5 15 – 3.6 – 3.0– 6.8 – 2.4
IOL Output
Sink
Current
HCC
Types5 0.4 5 0.64 0.51 1 0.36
0/10 0.5 10 1.6 1.3 2.6 0.9
0/15 1.5 15 4.2 3.4 6.8 2.4
HCF
Types5 0.4 5 0.52 0.44 1 0.36
0/10 0.5 10 1.3 1.1 2.6 0.9
0/15 1.5 15 3.6 3.0 6.8 2.4
IIH,IIL Input
Leakage
Current
HCC
Types
0/18
Any Input ± 0.1 ±10–5± 0.1 ±1
HCF
Types
0/15 15 ± 0.3 ±10–5± 0.3 ±1 Input Capacitance Any Input 5 7.5 pF
*TLow =–55°Cfor HCC device:– 40°Cfor HCF device.
*THigh=+ 125°C forHCCdevice:+ 85°C forHCF device.
The NoiseMarginfor both”1” and”0” levelis:1V min.withVDD= 5V,2V min.withVDD= 10V,2.5V min.withVDD= 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb =25°C,CL= 50pF, RL= 200kΩ,
typical temperature coefficientforall VDD= 0.3%/°C values,all input rise and fall time= 20ns)
ValueSymbol Parameter Test Conditions
VDD (V) Min. Typ. Max. Unit
CLOCKED OPERATION
tPLH,tPHL Propagation Delay Time 5 160 32010 80 160 60 120
tTHL,tTLH Transition Time 5 100 20010 50 100 40 80
fCL* Maximum Clock Input Frequency 5 3 6
MHz10 6 12 8.5 17 Clock Pulse Width 5 180 9010 80 40 50 25 Ifmore thanone unitis cascaded trCL shouldbe madeless thanor equaltothe sumofthe transition timeandthe fixedpropagation delayof
the outputof thedriving stageofthe estimated capacitive load.
HCC/HCF4014B/4021B
5/13
DYNAMIC ELECTRICAL CHARACTERISTICS (Continued)
Symbol Parameter Test Conditions Value UnitVDD(V) Min. Typ. Max.
CLOCKED OPERATION
tr,tf Clock Input Riseor Fall Time 5 1510 15 15
tsetup Setup Time, serial Input (ref.to CL) 5 120 6010 80 40 60 30
tsetup Setup Time, parallel Input (4014B)
(ref.to CL)
580 4010 50 25 40 20
tsetup Setup Time, parallel Input (4021B)
(ref.to P/S)
550 2510 30 15 20 10
tsetup Setup Time, parallel/serial Control (4014B)
(ref.to CL) 180 9010 80 40 60 30
thold Hold Time, serialin, parallelin,
parallel/serial Cotrol10 0 0
tWH P/S Pulse Width (4021B) 5 160 8010 80 40 50 25
trem P/S Removal time (4021B)
(ref.to CL) 280 14010 140 70 100 50
Typical Output Low (sink) Current Characteristics. Minimum Output Low (sink) Current Charac-
teristics. Ifmore thanone unitis cascaded trCL shouldbe madeless thanor equaltothe sumofthe transition timeandthe fixedpropagation delayof
the outputof thedriving stageofthe estimated capacitive load.
HCC/HCF4014B/4021B
6/13
Minimum Output High (source) Current Charac-
teristics.
Typical Output High (source) Current Charac-
teristics.
Typical Transition Time vs. Load Capacitance. Typical Propagation Delay Time vs. Load Capacit-
ance.
Typical Dynamic Power Dissapating vs. Clock
Input Frequency.
HCC/HCF4014B/4021B
7/13

Partno	Mfg	Dc	Qty	Available	Descript
HCF4021BF	SGS	N/a	3	avai	8-STAGE STATIC SHIFT REGISTERS