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HCF40174
HEX "D"
1/9September 2002 STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS QUIESCENT CURRENT SPECIFIED UP TO
20V 5V, 10V, AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT
II = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC
JESD13B "STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTIONHCF40174B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
HCF40174B consists of six identical "D" Type
flip-flops having independent DATA inputs. The
CLOCK and CLEAR inputs are common in all six
units. Data is transferred to the Q outputs on the
positive-going transition of the clock pulse. All six
flip-flops are simultaneously reset by a low level
on the CLEAR input.
HCF40174BHEX "D" TYPE FLIP-FLOP
PIN CONNECTION
ORDER CODES
HCF40174B2/9
IINPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE X : Don’t Care
NC : NO CHANGE
FUNCTIONAL DIAGRAM
HCF40174B3/9
LOGIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF40174B4/9
DC SPECIFICATIONS The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
HCF40174B5/9
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
HCF40174B6/9
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200KΩ
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
