FQA24N50F ,500V N-Channel MOSFETFeaturesThese N-Channel enhancement mode power field effect • 24A, 500V, R = 0.2Ω @V = 10 VDS(on) G ..
FQA24N50F ,500V N-Channel MOSFETFQA24N50FSeptember 2001TMFRFETFQA24N50F500V N-Channel MOSFET
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FQA24N50F
500V N-Channel MOSFET
FQA24N50F September 2001 TM FRFET FQA24N50F 500V N-Channel MOSFET General Description Features These N-Channel enhancement mode power field effect • 24A, 500V, R = 0.2Ω @V = 10 V DS(on) GS transistors are produced using Fairchild’s proprietary, • Low gate charge ( typical 90 nC) planar stripe, DMOS technology. • Low Crss ( typical 55 pF) This advanced technology has been especially tailored to • Fast switching minimize on-state resistance, provide superior switching • 100% avalanche tested performance, and withstand high energy pulse in the • Improved dv/dt capability avalanche and commutation mode. These devices are well • Fast recovery body diode ( max, 250ns ) suited for high efficiency switch mode power supplies, where the body diode is used such as phase-shift ZVS, basic full-bridge topology. D ! ! "" !!"" "" G! ! "" TO-3P ! ! G D S S FQA Series Absolute Maximum Ratings T = 25°C unless otherwise noted C Symbol Parameter FQA24N50F Units V Drain-Source Voltage 500 V DSS I - Continuous (T = 25°C) Drain Current 24 A D C - Continuous (T = 100°C) 15.2 A C I (Note 1) Drain Current - Pulsed 96 A DM V Gate-Source Voltage ± 30 V GSS E (Note 2) Single Pulsed Avalanche Energy 1100 mJ AS I Avalanche Current (Note 1) 24 A AR E (Note 1) Repetitive Avalanche Energy 29 mJ AR dv/dt Peak Diode Recovery dv/dt (Note 3) 15 V/ns P Power Dissipation (T = 25°C) 290 W D C - Derate above 25°C 2.33 W/°C T , T Operating and Storage Temperature Range -55 to +150 °C J STG Maximum lead temperature for soldering purposes, T 300 °C L 1/8" from case for 5 seconds Thermal Characteristics Symbol Parameter Typ Max Units R Thermal Resistance, Junction-to-Case -- 0.43 °C/W θJC R Thermal Resistance, Case-to-Sink 0.24 -- °C/W θCS R Thermal Resistance, Junction-to-Ambient -- 40 °C/W θJA ©2001 Rev. A2, September 2001
