DM54LS04J/883 ,Hex InverterGeneral DescriptionThis device contains six independent gates, each of which performs the logic INV ..
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DM54LS10J ,Triple 3-Input NAND GatesFeaturesYAlternate Military/Aerospace device (54LS10) is avail-Thisdevicecontainsthreeindependentga ..
DM54LS10N ,Triple 3-Input NAND Gates54LS10/DM54LS10/DM74LS10Triple3-InputNANDGatesJune198954LS10/DM54LS10/DM74LS10Triple3-InputNANDGate ..
DM54LS112AJ ,7 V, dual negative-edge-triggered master-slave J-K flip-flop with preset, clear and complementary outputFeatures
I Alternate Military/Aerospace device (54LS112) is avail-
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DS1642-100 ,Nonvolatile Timekeeping RAMPIN DESCRIPTION§ Lithium energy source is electricallyA0-A10 - Address Inputdisconnected to retain ..
DS1642-100+ ,Nonvolatile Timekeeping RAMPIN DESCRIPTION PIN NAME FUNCTION 1 A7 2 A6 3 A5 4 A4 5 A3 6 A2 Address Input 7 A1 8 A0 19 A10 22 A ..
DS1643 ,Nonvolatile Timekeeping RAMFEATURES PIN CONFIGURATIONS Integrated NV SRAM, Real-Time Clock, VN.C. 1 28 CCCrystal, Power-Fail ..
DS1643-100 ,Nonvolatile Timekeeping RAMBLOCK DIAGRAM Figure 1CLOCKOSCILLATOR ANDREGISTERS32.768 KHzCLOCK COUNTDOWNCHAINCEWE8K X 8 NV SRAMO ..
DS1643-100 ,Nonvolatile Timekeeping RAMFEATURES PIN ASSIGNMENT• Form, fit, and function compatible with the MK48T08NC 1 28 VCCTimekeeping ..
DS1643-100 ,Nonvolatile Timekeeping RAMDS1643DS1643Nonvolatile Timekeeping RAM
DM54LS04J/883
Hex Inverter
Original Creation Date: 04/23/98
Last Update Date: 05/14/98
Last Major Revision Date: 04/23/98
MNDM54LS04-X REV 1A0
MICROCIRCUIT DATA SHEET
HEX INVERTING GATES
General DescriptionThis device contains six independent gates, each of which performs the logic INVERT
function.
NS Part NumbersDM54LS04E/883
DM54LS04J/883
DM54LS04W/883
Industry Part Number54LS04
Prime DieL004
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55