COP8SAC728N9 ,8-Bit CMOS OTP Microcontroller with 4k Memory, 128 RAM, Power On Reset (POR), and Very Small PackagingFeatures- 8-bit OTP microcontroller - OTP program space with read/write protection(fully secured) - ..
COP8SAC740N8 ,8-Bit CMOS OTP Microcontroller with 4k Memory, 128 RAM, Power On Reset (POR), and Very Small PackagingGeneral Descriptionture, 10 MHz CKI with 1 μs instruction cycle, one multi-Note: COP8SAx devices ar ..
COP8SAC740N9 ,8-Bit CMOS OTP Microcontroller with 4k Memory, 128 RAM, Power On Reset (POR), and Very Small PackagingGeneral DescriptionThe COPSAC7 OTP microcontroller is a member of the COP8 feature family using an ..
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COP8SAC744V7 ,8-Bit CMOS ROM Based and One-Time Programmable OTP Microcontroller with 1k to 4k Memory, Power On Reset, and Very Small PackagingFeaturesn Versatile easy to use instruction set n Software selectable I/O options®— TRI-STATE Outpu ..
COP8SAC744V8 ,8-Bit CMOS OTP Microcontroller with 4k Memory, 128 RAM, Power On Reset (POR), and Very Small PackagingFeatures- 8-bit OTP microcontroller - OTP program space with read/write protection(fully secured) - ..
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COP8SAC720M8-COP8SAC720N9-COP8SAC728M9-COP8SAC728N9-COP8SAC740N9-COP8SAC744V8-COP8SAC7SLB8
8-Bit CMOS OTP Microcontroller with 4k Memory, 128 RAM, Power On Reset (POR), and Very Small Packaging
Original Creation Date: 09/02/99
Last Update Date: 05/15/00
Last Major Revision Date: 12/15/99
MNCOP8SAC728-X REV 0B0
MICROCIRCUIT DATA SHEET
8 Bit One-Time Programmable (OTP) Microcontroller
General DescriptionThe COPSAC7 OTP microcontroller is a member of the COP8 feature family using an 8-bit
single chip core architecture. These devices are fabricated in National Semiconductor's
high density EPROM process and are offered in a variety of packages, temperature ranges
and voltage ranges to satisfy a wide variety of applications.
NS Part NumbersCOP8SAC728J-MIL
Industry Part NumberCOP8SAC7
Prime DieTSL8SAC7A
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
