CM1293A-04SO ,4-Channel Low Capacitance ESD Protection ArrayMaximum Ratings are stress ratings only. Functional operation above theRecommended Operating Condit ..
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CM1293A-04SO
4-Channel Low Capacitance ESD Protection Array
CM1293A-04SO
4-Channel
Low Capacitance
ESD Protection Array
Product Description CM1293A−04SO has been designed to provide ESD protection for
electronic components or subsystems requiring minimal capacitive
loading. This device is ideal for protecting systems with high data and
clock rates or for circuits requiring low capacitive loading. Each ESD
channel consists of a pair of diodes in series that steer the positive or
negative ESD current pulse to either the positive (VP) or negative (VN)
supply rail. A Zener diode is embedded between VP and VN which
helps protect the VCC rail against ESD strikes. This device protects
against ESD pulses up to 8 kV contact discharge) per the
IEC 61000−4−2 Level 4 standard.
This device is particularly well−suited for protecting systems using
high−speed ports such as USB2.0, IEEE1394 (FireWire , i.LINK�),
Serial ATA, DVI, HDMI, and corresponding ports in removable
storage, digital camcorders, DVD−RW drives and other applications
where extremely low loading capacitance with ESD protection are
required in a small package footprint.
Features Four Channels of ESD Protection Provides ESD Protection to IEC61000−4−2 8 kV Contact Discharge Low Loading Capacitance of 2.0 pF Max Low Clamping V oltage Channel I/O to I/O Capacitance 1.5 pF Typical Zener Diode Protects Supply Rail and Eliminates the Need for
External By−Pass Capacitors Each I/O Pin Can Withstand over 1000 ESD Strikes* This Device is Pb−Free and is RoHS Compliant**
Applications DVI Ports, HDMI Ports in Notebooks, Set Top Boxes, Digital TVs,
LCD Displays Serial ATA Ports in Desktop PCs and Hard Disk Drives PCI Express Ports General Purpose High−Speed Data Line ESD Protection
**Standard test condition is IEC61000−4−2 level 4 test circuit with each pinsubjected to 8 kV contact discharge for 1000 pulses. Discharges are timed at1 second intervals and all 1000 strikes are completed in one continuous test run.The part is then subjected to standard production test to verify that all of thetested parameters are within spec after the 1000 strikes.
**For additional information on our Pb−Free strategy and soldering details,
