ADXRS150ABG ,Angular Rate Sensor ADXRS150APPLICATIONS to lower the scale factor. An external capacitor is used to set the GPS navigation sys ..
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ADXRS300ABG ,Angular Rate Sensor ADXRS300specifications range ±300 °/s Initial @25°C 4.6 5 5.4 mV/°/s 3Over Temperature VS = 4.75 V to 5.2 ..
ADXRS450BEYZ , HIgh Performance, Digital Output Gyroscope
ADXRS620BBGZ , ±300°/sec Yaw Rate Gyro
ADZS-HPUSB-ICE , Analog Devices USB-Based Emulator and High Performance USB-Based Emulator
AM28F010-150EC , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
AM28F010-150JI , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
AM28F010-150JI , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
AM28F010-150PI , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
AM28F010-200JC , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
AM28F010-200JI , 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
ADXRS150ABG
Angular Rate Sensor ADXRS150
±150°/s Single Chip Yaw Rate
Gyro with Signal Conditioning
FEATURES
Complete rate gyroscope on a single chip
Z-axis (yaw rate) response
High vibration rejection over wide frequency
0.05°/s/√Hz noise
2000 g powered shock survivability
Self-test on digital command
Temperature sensor output
Precision voltage reference output
Absolute rate output for precision applications
5 V single-supply operation
Ultrasmall and light (< 0.15 cc, < 0.5 gram)
APPLICATIONS
GPS navigation systems
Vehicle stability control
Inertial measurement units
Guidance and control
Platform stabilization
GENERAL DESCRIPTION The ADXRS150 is a complete angular rate sensor (gyroscope)
that uses Analog Devices’ surface-micromachining process to
make a functionally complete and low cost angular rate sensor
integrated with all of the required electronics on one chip.
The manufacturing technique for this device is the same high
volume BIMOS process used for high reliability automotive
airbag accelerometers.
The output signal, RATEOUT (1B, 2A), is a voltage proportional
to the angular rate about the axis normal to the top surface of
the package (see Figure 2). A single external resistor can be used
to lower the scale factor. An external capacitor is used to set the
bandwidth. Other external capacitors are required for operation
(see Figure 22).
A precision reference and a temperature output are also pro-
vided for compensation techniques. Two digital self-test inputs
electromechanically excite the sensor to test the operation of
both sensors and the signal conditioning circuits. The ADXRS150
is available in a 7 mm × 7 mm × 3 mm BGA surface-mount
package.
FUNCTIONAL BLOCK DIAGRAM Figure 1.
Rev. B
TABLE OF CONTENTS Specifications.....................................................................................3
Absolute Maximum Ratings............................................................4
Rate Sensitive Axis........................................................................4
ESD Caution..................................................................................4
Pin Configurations and Function Descriptions...........................5
Typical Performance Characteristics.............................................6
Theory of Operation........................................................................9
Supply and Common Considerations.......................................9
Setting Bandwidth........................................................................9
Increasing Measurement Range...............................................10
Temperature Output and Calibration......................................10
Using the ADXRS150 with a Supply-Ratiometric ADC......10
Null Adjustment.........................................................................10
Self-Test Function......................................................................10
Continuous Self-Test..................................................................10
Acceleration Sensitivity.............................................................11
Outline Dimensions.......................................................................12
Ordering Guide..........................................................................12
REVISION HISTORY
3/04—Data Sheet Changed from Rev. A to Rev. B Updated Format..................................................................Universal
Changes to Table 1 Conditions.......................................................3
Added Evaluation Board to Ordering Guide..............................12
1/03—Data Sheet Changed from Rev. 0 to Rev. A Edit to Figure 5..................................................................................5
SPECIFICATIONS @TA = 25°C, VS = 5 V, bandwidth = 80 Hz (COUT = 0.01 µF), angular rate = 0°/s, ±1g, unless otherwise noted.
Table 1. All min and max specifications are guaranteed. Typical specifications are not tested or guaranteed.
2 Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at
5 V supplies.
3 Specification refers to the maximum extent of this parameter as a worst-case value at TMIN or TMAX.
ABSOLUTE MAXIMUM RATINGS
Table 2. Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at these or any
other conditions above those indicated in the operational sec-
tion of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Applications requiring more than 200 cycles to MIL-STD-883
Method 1010 Condition B (–55°C to +125°C) require underfill
or other means to achieve this requirement.
Drops onto hard surfaces can cause shocks of greater than
2000 g and exceed the absolute maximum rating of the device.
Care should be exercised in handling to avoid damage.
RATE SENSITIVE AXIS This is a Z-axis rate-sensing device that is also called a yaw rate
sensing device. It produces a positive going output voltage for
clockwise rotation about the axis normal to the package top, i.e.,
clockwise when looking down at the package lid.
Figure 2. RATEOUT Signal Increases with Clockwise Rotation
ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AGND
TEMP
ST2
ST1
PGND
CP4
RATEOUTEDCBA
CMIDSUMJ2.5V03226-B
Figure 3. BGA-32 (Bottom View)
Table 3. Pin Function Descriptions TYPICAL PERFORMANCE CHARACTERISTICS
TIME (sec)
RATE
UT (V
3.50.100.20Figure 4. Rate Sensing Start-Up Time
Figure 5. Null Stability for 1 Hour
Figure 6. Temperature Sensor Output
Figure 7. Null Settling Time
Figure 8. Root Allan Variance vs. Averaging Time
Figure 9. 2.5 V Voltage Reference vs. Temperature