AD9020KZ ,10-Bit 60 MSPS A/D Converterspecifications.4Measured with ANALOG IN = +V .SENSE5Output delay measured as worst-case time from 5 ..
AD9022AQ ,12-Bit 20 MSPS Monolithic A/D ConverterAPPLICATIONST/H16DAC –5.2VRadar ReceiversGNDDigital Communications+2V4-BIT8REFDigital Instrumentati ..
AD9022SQ ,12-Bit 20 MSPS Monolithic A/D ConverterCHARACTERISTICSTest AD9022AQ/AZ AD9022BQ/BZ AD9022SQ/SZParameter (Conditions) Temp Level Min Typ ..
AD9040AJN ,10-Bit 40 MSPS A/D ConverterCHARACTERISTICS otherwise noted)Test AD9040AJN/JRParameter (Conditions) Temp Level Min Typ Max Unit ..
AD9040AJR ,10-Bit 40 MSPS A/D ConverterGENERAL DESCRIPTIONPRODUCT HIGHLIGHTSThe AD9040A is a complete 10-bit monolithic sampling analog-1. ..
AD9042AD ,12-Bit, 41 MSPS Monolithic A/D ConverterAPPLICATIONSTIMINGENCODE MSB LSBCellular/PCS Base StationsGPS Anti-Jamming ReceiversGNDD11 D10 D9 D ..
ADS5423IPJYRG4 ,14 Bit, 80 MSPS Analog-to-Digital ConverterMAXIMUM RATINGSsusceptible to damage because small parametric changes could cause(1)over operating ..
ADS5424IPGP ,5V 14bit, 105MSPS High Performance Bipolar Analog-to-Digital Converter 52-HTQFP -40 to 85ELECTRICAL CHARACTERISTICS Over full temperature range (T = −40°C to T = 85°C), sampling rate = 105 ..
ADS5424IPJY ,5V 14bit, 105MSPS High Performance Bipolar Analog-to-Digital ConverterFEATURESHeatsink 14 Bit Resolution Pin Compatible to the AD6644/45 105 MSPS Maximum Sample Rate ..
ADS5440IPFP ,13-BIT 210 MSPS ANALOG-TO-DIGITAL CONVERTERFEATURES APPLICATIONS• Test and Measurement• 13-Bit Resolution• Software-Defined Radio• 210 MSPS Sa ..
ADS5444IPFP ,13-BIT 250 MSPS ANALOG-TO-DIGITAL CONVERTERFEATURES APPLICATIONS• Test and Measurement• 13-Bit Resolution• Software-Defined Radio• 250 MSPS Sa ..
ADS5463IPFP ,12-bit, 500 MSPS Analog-to-Digital Converter with Buffered Input 80-HTQFP FEATURES • Industrial Temperature Range: –40°C to 85°C23• 12-Bit Resolution • Pin-Similar/Compatibl ..
AD9020JE-AD9020JZ-AD9020KE-AD9020KZ
10-Bit 60 MSPS A/D Converter
REV.A
10-Bit 60 MSPS
A/D Converter
FUNCTIONAL BLOCK DIAGRAM
–VS+VSENCODE
ANALOG IN
GROUND
OVERFLOW
(MSB)
(LSB)
LSBS
INVERT
MSB
INVERT
3/4REF
+VREF
+VSENSE
1/2REF
1/4REF
–VREF
–VSENSE
FEATURES
Monolithic 10-Bit/60 MSPS Converter
TTL Outputs
Bipolar (61.75 V) Analog Input
56 dB SNR @ 2.3 MHz Input
Low (45 pF) Input Capacitance
MIL-STD-883 Compliant Versions Available
APPLICATIONS
Digital Oscilloscopes
Medical Imaging
Professional Video
Radar Warning/Guidance Systems
Infrared Systems
GENERAL DESCRIPTIONThe AD9020 A/D converter is a 10-bit monolithic converter
capable of word rates of 60 MSPS and above. Innovative archi-
tecture using 512 input comparators instead of the traditional
1024 required by other flash converters reduces input capaci-
tance and improves linearity.
Encode and outputs are TTL-compatible, making the AD9020
an ideal candidate for use in low power systems. An overflow
bit is provided to indicate analog input signals greater than
+VSENSE.
Voltage sense lines are provided to insure accurate driving of theVREF voltages applied to the units. Quarter-point taps on the
resistor ladder help optimize the integral linearity of the unit.
Either 68-pin ceramic leaded (gull wing) packages or ceramic
LCCs are available and are specifically designed for low thermal
impedances. Two performance grades for temperatures of both
0°C to +70°C and –55°C to +125°C ranges are offered to allow
the user to select the linearity best suited for each application.
Dynamic performance is fully characterized and production
tested at +25°C. MIL-STD-883 units are available.
The AD9020 A/D Converter is available in versions compliant
with MIL-STD-883. Refer to the Analog Devices Military Prod-
ucts Databook or current AD9020/883B data sheet for detailed
specifications.
AD9020–SPECIFICATIONS
ELECTRICAL CHARACTERISTICSANALOG INPUT
REFERENCE INPUT
SWITCHING PERFORMANCE
(6VS = 65 V; 6VSENSE = 61.75 V; ENCODE = 40 MSPS unless otherwise noted)
ABSOLUTE MAXIMUM RATINGS1+VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+6 V
–VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–6 V
ANALOG IN . . . . . . . . . . . . . . . . . . . . . . . . . . .–2 V to +2 V
+VREF, –VREF, 3/4REF, 1/2REF, 1/4REF . . . . . . . . . .–2 V to +2 V
+VREF to –VREF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.0 V
DIGITAL INPUTS . . . . . . . . . . . . . . . . . . . . . . .–0.5 V to +VS
3/4REF, 1/2REF, 1/4REF Current . . . . . . . . . . . . . . . . . . .±10 mA
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . .20 mA
Operating Temperature
AD9020JE/KE/JZ/KZ . . . . . . . . . . . . . . . . . .0°C to +70°C
Storage Temperature . . . . . . . . . . . . . . . . . . .–65°C to +150°C
Maximum Junction Temperature2 . . . . . . . . . . . . . . . .+175°C
Lead Soldering Temp (10 sec) . . . . . . . . . . . . . . . . . . .+300°C
ENCODE INPUT
DIGITAL OUTPUTS
POWER SUPPLY
NOTESAbsolute maximum ratings are limiting values to be applied individually, and beyond which the service ability of the circuit may be impaired. Functional operability is
not necessarily implied. Exposure to absolute maximum rating conditions for an extended period of time may affect device reliability.Typical thermal impedances (part soldered onto board): 68-pin leaded ceramic chip carrier: θJC = 1°C/W; θJA = 17°C/W (no air flow); θJA = 15°C/W
(air flow = 500 LFM). 68-pin ceramic LCC: θJC = 2.6°C/W; θJA = 15°C/W (no air flow); θJA = 13°C/W (air flow = 500 LFM).3/4REF, 1/2REF, and 1/4REF reference ladder taps are driven from dc sources at +0.875 V, 0 V, and –0.875 V, respectively. Accuracy of the overflow comparator is not
tested and not included in linearity specifications.Measured with ANALOG IN = +VSENSE.Output delay measured as worst-case time from 50% point of the rising edge of ENCODE to 50% point of the slowest rising or falling edge of D0–D9. Output skew
measured as worst-case difference in output delay among D0–D9.RMS signal to rms noise with analog input signal 1 dB below full scale at specified frequency.Intermodulation measured with analog input frequencies of 2.3 MHz and 3.0 MHz at 7 dB below full scale.Measured as the ratio of the worst-case change in transition voltage of a single comparator for a 5% change in +VS or –VS.
Specifications subject to change without notice.
AD9020
AD9020
ORDERING GUIDE*E = Ceramic Leadless Chip Carrier; Z = Ceramic Leaded Chip Carrier.
DIE LAYOUT AND MECHANICAL INFORMATIONDie Dimensions . . . . . . . . . . . . . . .206 3 140 3 15 (±2) mils
Pad Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 3 4 mils
Metalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Gold
Backing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .None
Substrate Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–VS
Passivation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Nitride
EXPLANATION OF TEST LEVELSTest Level–100% production tested.–100% production tested at +25°C, and sample tested at
specified temperatures.
III–Sample tested only.–Parameter is guaranteed by design and characterization
testing.–Parameter is a typical value only.–All devices are 100% production tested at +25°C. 100%
production tested at temperature extremes for extended
temperature devices; sample tested at temperature ex-
tremes for commercial/industrial devices.
NC = NO CONNECT
AD9020
TOP VIEW
(Not to Scale)+VSENSE
+VREF
GND
ENCODE
GND
(LSB) D0
ANALOG INANALOG IN3/4
REF
GNDGND–V
1/2
REF
1/4
REFGNDGNDMSB INVERT
LSBs INVERT
GND
OVERFLOW
D9 (MSB)
GNDGNDGNDGNDGNDGNDGND
+VS
+VS
–VS
+VS
–VSENSE
–VREF
+VS
–VS
+VS
+VS
AD9020 PIN FUNCTION DESCRIPTIONS2, 16, 28, 29, 35, 41, 42,
54, 64
3, 6, 15, 18, 25, 30, 33, 34,
37, 40, 45, 52, 55, 65, 68
4, 5, 13, 17, 27, 31, 32,
36, 38, 39, 43, 53, 66, 67
8, 9
AD9020
THEORY OF OPERATIONRefer to the AD9020 block diagram. As shown, the AD9020
uses a modified “flash,” or parallel, A/D architecture. The ana-
log input range is determined by an external voltage reference
(+VREF and –VREF), nominally ±1.75 V. An internal resistor lad-
der divides this reference into 512 steps, each representing two
quantization levels. Taps along the resistor ladder (1/4REF,
1/2REF and 3/4REF) are provided to optimize linearity. Rated per-
formance is achieved by driving these points at 1/4, 1/2 and 3/4,
respectively, of the voltage reference range.
The A/D conversion for the nine most significant bits (MSBs) is
performed by 512 comparators. The value of the least signifi-
cant bit (LSB) is determined by a unique interpolation scheme
between adjacent comparators. The decoding logic processes
the comparator outputs and provides a 10-bit code to the output
stage of the converter.
Flash architecture has an advantage over other A/D architec-
tures because conversion occurs in one step. This means the
performance of the converter is primarily limited by the speed
and matching of the individual comparators. In the AD9020, an
innovative interpolation scheme takes advantage of flash archi-
tecture but minimizes the input capacitance, power and device
count usually associated with that method of conversion.
These advantages occur by using only half the normal number
of input comparator cells to accomplish the conversion. In addi-
tion, a proprietary decoding scheme minimizes error codes. In-
put control pins allow the user to select from among Binary,
Inverted Binary, Twos Complement and Inverted Twos
Complement coding (see AD9020 Truth Table).
APPLICATIONSMany of the specifications used to describe analog/digital con-
verters have evolved from system performance requirements in
these applications. Different systems emphasize particular speci-
fications, depending on how the part is used. The following ap-
plications highlight some of the specifications and features that
make the AD9020 attractive in these systems.
Wideband ReceiversRadar and communication receivers (baseband and direct IF
digitization), ultrasound medical imaging, signal intelligence
and spectral analysis all place stringent ac performance require-
ments on analog-to-digital converters (ADCs). Frequency do-
main characterization of the AD9020 provides signal-to-noise
ratio (SNR) and harmonic distortion data to simplify selection
of the ADC.
Receiver sensitivity is limited by the Signal-to-Noise Ratio of the
system. The SNR for an ADC is measured in the frequency do-
main and calculated with a Fast Fourier Transform (FFT). The
SNR equals the ratio of the fundamental component of the sig-
nal (rms amplitude) to the rms value of the noise. The noise is
the sum of all other spectral components, including harmonic
distortion, but excluding dc.
Good receiver design minimizes the level of spurious signals in
the system. Spurious signals developed in the ADC are the re-
sult of imperfections in the device transfer function (non-
linearities, delay mismatch, varying input impedance, etc.). In
the ADC, these spurious signals appear as Harmonic Distortion.
Harmonic Distortion is also measured with an FFT and is speci-
fied as the ratio of the fundamental component of the signal
(rms amplitude) to the rms value of the worst case harmonic
(usually the 2nd or 3rd).
Two-Tone Intermodulation Distortion (IMD) is a frequently cited
specification in receiver design. In narrow-band receivers, third-
order IMD products result in spurious signals in the pass band
of the receiver. Like mixers and amplifiers, the ADC is charac-
terized with two, equal-amplitude, pure input frequencies. The
IMD equals the ratio of the power of either of the two input sig-
nals to the power of the strongest third-order IMD signal. Un-
like mixers and amplifiers, the IMD does not always behave as it
does in linear devices (reduced input levels do not result in pre-
dictable reductions in IMD).
Performance graphs provide typical harmonic and SNR data for
the AD9020 for increasing analog input frequencies. In choos-
ing an A/D converter, always look at the dynamic range for the
analog input frequency of interest. The AD9020 specifications
provide guaranteed minimum limits at three analog test
frequencies.
Aperture Delay is the delay between the rising edge of the EN-
CODE command and the instant at which the analog input is
sampled. Many systems require simultaneous sampling of more
than one analog input signal with multiple ADCs. In these situ-
ations, timing is critical and the absolute value of the aperture
delay is not as critical as the matching between devices.
Aperture Uncertainty, or jitter, is the sample-to-sample variation
in aperture delay. This is especially important when sampling
high slew rate signals in wide bandwidth systems. Aperture un-
certainty is one of the factors that degrade dynamic performance
as the analog input frequency is increased.