AD5335 Fast Delivery |IC PHOENIX CO.,LIMITED

AD5335 ,+2.5V to 5.5V, 500礎 Quad Rail-to-Rail Voltage Output 10-Bit DAC with Parallel Interface in 24-lead TSSOPCHARACTERISTICS4, 7Minimum Output Voltage 0.001 V min Rail-to-Rail Operation4, 7Maximum Output Volt ..
AD5336BRU ,2.5 V to 5.5 V, 500 uA, Parallel Interface Quad Voltage-Output 8-/10-/12-Bit DACsCHARACTERISTICS4, 7Minimum Output Voltage 0.001 V min Rail-to-Rail Operation4, 7Maximum Output Volt ..
AD5336BRUZ , 2.5 V to 5.5 V, 500 A, Parallel Interface Quad Voltage-Output 8-/10-/12-Bit DACs
AD5336BRUZ , 2.5 V to 5.5 V, 500 A, Parallel Interface Quad Voltage-Output 8-/10-/12-Bit DACs
AD5337ARM ,2.5 V to 5.5 V, 250 µA, 2-Wire Interface Dual Voltage Output, 8-Bit D/A ConverterSpecifications subject to change without notice. No license is granted by implication www.analog.c ..
AD5337ARM-REEL7 ,2.5 V to 5.5 V, 250 µA, 2-Wire Interface Dual Voltage Output, 8-Bit D/A ConverterFEATURES AD5337/AD5338/AD5339 are dual 8-, 10-, and 12-bit buffered AD5337 voltage output DACs in a ..
AD9246BCPZ-105 , 14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Analog-to-Digital Converter
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AD9248BCPZ-40 ,Dual 14-Bit, 20/40/65 MSPS, 3 V ADCSpecifications .. 7 Data Format 18 Absolute Maximum Ratings ........9 Voltage Reference 19 ESD Cau ..
AD9248BCPZ-65 ,Dual 14-Bit, 20/40/65 MSPS, 3 V ADCfeatures dual high performance sample-and performance to suit an application. hold amplifiers and a ..
AD9248BST-40 ,14-Bit/ 20/40/65 MSPS Dual A/ D Converterfeatures dual high performance sample-and performance to suit an application. hold amplifiers and a ..

AD5335
+2.5V to 5.5V, 500礎 Quad Rail-to-Rail Voltage Output 10-Bit DAC with Byte-Load Parallel Interface in 28-lead TSSOP
REV.0
2.5 V to 5.5 V, 500 �A, Parallel Interface
Quad Voltage-Output 8-/10-/12-Bit DACs
AD5334 FUNCTIONAL BLOCK DIAGRAM
(Other Diagrams Inside)
VOUTA
GND
AD5334
VOUTB
VOUTC
VOUTD
TO ALL DACS
AND BUFFERS
VREFC/D
VDDVREFA/B
GAIN
DB7
DB0
CLR
LDAC.
FEATURES
AD5334: Quad 8-Bit DAC in 24-Lead TSSOP
AD5335: Quad 10-Bit DAC in 24-Lead TSSOP
AD5336: Quad 10-Bit DAC in 28-Lead TSSOP
AD5344: Quad 12-Bit DAC in 28-Lead TSSOP
Low Power Operation: 500 �A @ 3 V, 600 �A @ 5 V
Power-Down to 80 nA @ 3 V, 200 nA @ 5 V via PD Pin
2.5 V to 5.5 V Power Supply
Double-Buffered Input Logic
Guaranteed Monotonic by Design Over All Codes
Output Range: 0–VREF or 0–2 VREF
Power-On Reset to Zero Volts
Simultaneous Update of DAC Outputs via LDAC Pin
Asynchronous CLR Facility
Low Power Parallel Data Interface
On-Chip Rail-to-Rail Output Buffer Ampliﬁers
Temperature Range: –40�C to +105�C
APPLICATIONS
Portable Battery-Powered Instruments
Digital Gain and Offset Adjustment
Programmable Voltage and Current Sources
Programmable Attenuators
Industrial Process Control
GENERAL DESCRIPTION
The AD5334/AD5335/AD5336/AD5344 are quad 8-, 10-, and
12-bit DACs. They operate from a 2.5 V to 5.5 V supply con-
suming just 500 µA at 3 V, and feature a power-down mode that
further reduces the current to 80 nA. These devices incorporate
an on-chip output buffer that can drive the output to both sup-
ply rails.
The AD5334/AD5335/AD5336/AD5344 have a parallel interface.
CS selects the device and data is loaded into the input registers
on the rising edge of WR.
The GAIN pin on the AD5334 and AD5336 allows the output
range to be set at 0 V to VREF or 0 V to 2 × VREF.
Input data to the DACs is double-buffered, allowing simultaneous
update of multiple DACs in a system using the LDAC pin.
On the AD5334, AD5335 and AD5336 an asynchronous CLR
input is also provided. This resets the contents of the Input
Register and the DAC Register to all zeros. These devices also
incorporate a power-on-reset circuit that ensures that the DAC
output powers on to 0 V and remains there until valid data is
written to the device.
The AD5334/AD5335/AD5336/AD5344 are available in Thin
Shrink Small Outline Packages (TSSOP).
*. Patent Number 5,969,657; other patents pending.
AD5334/AD5335/AD5336/AD5344–SPECIFICATIONS
(VDD = 2.5 V to 5.5 V, VREF = 2 V. RL = 2 k� to GND; CL =200 pF to GND; all speciﬁcations TMIN to TMAX unless otherwise noted.)
OUTPUT CHARACTERISTICS
POWER REQUIREMENTS
NOTESSee Terminology section.Temperature range: B Version: –40°C to +105°C; typical speciﬁcations are at 25°C.Linearity is tested using a reduced code range: AD5334 (Code 8 to 255); AD5335/AD5336 (Code 28 to 1023); AD5344 (Code 115 to 4095).DC speciﬁcations tested with outputs unloaded.This corresponds to x codes. x = Deadband voltage/LSB size.Guaranteed by design and characterization, not production tested.
AD5334/AD5335/AD5336/AD5344
AC CHARACTERISTICS1
Output Voltage Settling Time
Slew Rate
Major Code Transition Glitch Energy
Digital Feedthrough
Digital Crosstalk
Analog Crosstalk
DAC-to-DAC Crosstalk
Multiplying Bandwidth
NOTES
1Guaranteed by design and characterization, not production tested.
2See Terminology section.
3Temperature range: B Version: –40°C to +105°C; typical speciﬁcations are at 25°C.
Speciﬁcations subject to change without notice.
TIMING CHARACTERISTICS1, 2, 3
t10
t11
t12
t13
NOTESGuaranteed by design and characterization, not production tested.All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD)
and timed from a voltage level of (VIL + VIH)/2.See Figure 1.
Speciﬁcations subject to change without notice.
(VDD = 2.5 V to 5.5 V. RL = 2 k� to GND; CL = 200 pF to GND. All speciﬁcations TMIN to TMAX unless other-
wise noted.)
(VDD = 2.5 V to 5.5 V, All speciﬁcations TMIN to TMAX unless otherwise noted.)
AD5334/AD5335/AD5336/AD5344
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD5334/AD5335/AD5336/AD5344 features proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS*
(TA = 25°C unless otherwise noted)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . .–0.3 V to +7 V
Digital Input Voltage to GND . . . . . . . .–0.3 V to VDD + 0.3 V
Digital Output Voltage to GND . . . . . .–0.3 V to VDD + 0.3 V
Reference Input Voltage to GND . . . .–0.3 V to VDD + 0.3 V
VOUT to GND . . . . . . . . . . . . . . . . . . .–0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . .–40°C to +105°C
Storage Temperature Range . . . . . . . . . . . .–65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . .150°C
TSSOP Package
Power Dissipation . . . . . . . . . . . . . . .(TJ max – TA)/θJA mW
θJA Thermal Impedance (24-Lead TSSOP) . . . . .128°C/W
θJA Thermal Impedance (28-Lead TSSOP) . . . . .97.9°C/W
θJC Thermal Impedance (24-Lead TSSOP) . . . . . .42°C/W
θJC Thermal Impedance (28-Lead TSSOP) . . . . . .14°C/W
Reflow Soldering
Peak Temperature . . . . . . . . . . . . . . . . . . . . . .220 +5/–0°C
Time at Peak Temperature . . . . . . . . . . . . .10 sec to 40 sec
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this speciﬁcation is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
ORDERING GUIDE
AD5334 FUNCTIONAL BLOCK DIAGRAM
VOUTA
GND
AD5334
VOUTB
VOUTC
VOUTD
TO ALL DACS
AND BUFFERS
VREFC/D
VDDVREFA/B
GAIN
DB7
DB0
CLR
LDAC.
AD5334 PIN FUNCTION DESCRIPTIONS
3VOUTA
AD5334 PIN CONFIGURATION
AD5334/AD5335/AD5336/AD5344
AD5335 FUNCTIONAL BLOCK DIAGRAM..VOUTA
GND
AD5335
VOUTB
VOUTC
VOUTD
TO ALL DACS
AND BUFFERS
VREFC/D
VDDVREFA/B
HBEN
DB7
DB0
CLR
LDAC
AD5335 PIN FUNCTION DESCRIPTIONS
AD5335 PIN CONFIGURATION
AD5336 FUNCTIONAL BLOCK DIAGRAM
VOUTA
GND
AD5336
VOUTB
VOUTC
VOUTD
TO ALL DACS
AND BUFFERS
VREFC
VDDVREFB
GAIN
DB9
DB0
CLR
LDAC.
VREFA
VREFD
AD5336 PIN FUNCTION DESCRIPTIONS
AD5336 PIN CONFIGURATION
AD5334/AD5335/AD5336/AD5344
AD5344 FUNCTIONAL BLOCK DIAGRAM
VOUTA
GND
AD5344
VOUTB
VOUTC
VOUTD
TO ALL DACS
AND BUFFERS
VREFC
VDDVREFB
LDAC
VREFA
VREFD..
DB11
DB0
AD5344 PIN FUNCTION DESCRIPTIONS
AD5344 PIN CONFIGURATION
TERMINOLOGY
RELATIVE ACCURACY
For the DAC, Relative Accuracy or Integral Nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight
line passing through the actual endpoints of the DAC transfer
function. Typical INL versus Code plot can be seen in Figures
5, 6, and 7.
DIFFERENTIAL NONLINEARITY
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A speciﬁed differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed mono-
tonic by design. Typical DNL versus Code plot can be seen in
Figures 8, 9, and 10.
OFFSET ERROR
This is a measure of the offset error of the DAC and the output
ampliﬁer. It is expressed as a percentage of the full-scale range.
If the offset voltage is positive, the output voltage will still be
positive at zero input code. This is shown in Figure 3. Because
the DACs operate from a single supply, a negative offset cannot
appear at the output of the buffer ampliﬁer. Instead, there will
be a code close to zero at which the ampliﬁer output saturates
(ampliﬁer footroom). Below this code there will be a deadband
over which the output voltage will not change.This is illustrated
in Figure 4.
GAIN ERROR
This is a measure of the span error of the DAC (including any
error in the gain of the buffer ampliﬁer). It is the deviation in
slope of the actual DAC transfer characteristic from the ideal
expressed as a percentage of the full-scale range. This is illus-
trated in Figure 2.
Figure 2.Gain Error
Figure 3.Positive Offset Error and Gain Error
Figure 4.Negative Offset Error and Gain Error
AD5334/AD5335/AD5336/AD5344
OFFSET ERROR DRIFT
This is a measure of the change in Offset Error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
GAIN ERROR DRIFT
This is a measure of the change in Gain Error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
DC POWER-SUPPLY REJECTION RATIO (PSRR)
This indicates how the output of the DAC is affected by changes in
the supply voltage. PSRR is the ratio of the change in VOUT to a
change in VDD for full-scale output of the DAC. It is measured
in dBs. VREF is held at 2 V and VDD is varied ±10%.
DC CROSSTALK
This is the dc change in the output level of one DAC at mid-
scale in response to a full-scale code change (all 0s to all 1s and
vice versa) and output change of another DAC. It is expressed
in µV.
REFERENCE FEEDTHROUGH
This is the ratio of the amplitude of the signal at the DAC output
to the reference input when the DAC output is not being updated
(i.e., LDAC is high). It is expressed in dBs.
CHANNEL-TO-CHANNEL ISOLATION
This is a ratio of the amplitude of the signal at the output of one
DAC to a sine wave on the reference inputs of the other DACs.
It is measured by grounding one VREF pin and applying a 10kHz,V peak-to-peak sine wave to the other VREF pins. It is expressed
in dBs.
MAJOR-CODE TRANSITION GLITCH ENERGY
Major-Code Transition Glitch Energy is the energy of the
impulse injected into the analog output when the DAC changes
state. It is normally speciﬁed as the area of the glitch in nV secs
and is measured when the digital code is changed by 1 LSB at
the major carry transition (011...11 to 100...00 or 100...00
to 011...11).
DIGITAL FEEDTHROUGH
Digital Feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital input pins of the
device but is measured when the DAC is not being written to
(CS held high). It is speciﬁed in nV-secs and is measured with a
full-scale change on the digital input pins, i.e. from all 0s to all
1s and vice versa.
DIGITAL CROSSTALK
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
expressed in nV secs.
ANALOG CROSSTALK
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of another DAC. It is measured
by loading one of the input registers with a full-scale code change
(all 0s to all 1s and vice versa) while keeping LDAC high. Then
pulse LDAC low and monitor the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV secs.
DAC-TO-DAC CROSSTALK
This is the glitch impulse transferred to the output of one DAC
due to a digital code change and subsequent output change of
another DAC. This includes both digital and analog crosstalk. It
is measured by loading one of the DACs with a full-scale code
change (all 0s to all 1s and vice versa) with the LDAC pin set
low and monitoring the output of another DAC. The energy of
the glitch is expressed in nV secs.
MULTIPLYING BANDWIDTH
The ampliﬁers within the DAC have a ﬁnite bandwidth. The
Multiplying Bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The Multiplying Bandwidth is the frequency at which
the output amplitude falls to 3 dB below the input.
TOTAL HARMONIC DISTORTION
This is the difference between an ideal sine wave and its attenuated
version using the DAC. The sine wave is used as the reference
for the DAC and the THD is a measure of the harmonics present
on the DAC output. It is measured in dBs.

Partno	Mfg	Dc	Qty	Available	Descript
AD5335	AD	N/a	16	avai	+2.5V to 5.5V, 500礎 Quad Rail-to-Rail Voltage Output 10-Bit DAC with Parallel Interface in 24-lead TSSOP