74AC20MTR ,DUAL 4-INPUT NAND GATE74AC20DUAL 4-INPUT NAND GATE ■ HIGH SPEED: t = 4ns (TYP.) at V = 5VPD CC■ LOW POWER DISSIPATION:I ..
74AC20PC ,Dual 4-Input NAND GateFeaturesThe AC20 contains four 4-input NAND gates.
74AC20M-74AC20MTR
DUAL 4-INPUT NAND GATE
1/8April 2001 HIGH SPEED: tPD = 4ns (TYP .) at VCC = 5V LOW POWER DISSIPATION:CC = 2μA(MAX.) at TA =25°C HIGH NOISE IMMUNITY:
VNIH = VNIL = 28 % VCC (MIN.) 50Ω TRANSMISSION LINE DRIVING
CAPABILITY SYMMETRICAL OUTPUT IMPEDANCE:OH| = IOL = 24mA (MIN) BALANCED PROPAGATION DELAYS:PLH ≅ tPHL OPERATING VOLTAGE RANGE:
VCC (OPR) = 2V to 6V PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 20 IMPROVED LATCH-UP IMMUNITY
DESCRIPTIONThe 74AC20 is an advanced high-speed CMOS
DUAL 4-INPUT NAND GATE fabricated with
sub-micron silicon gate and double-layer metal
wiring C2 MOS tecnology.
The internal circuit is composed of 3 stages
including buffer output, which enables high noise
immunity and stable output.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
74AC20DUAL 4-INPUT NAND GATE
PIN CONNECTION AND IEC LOGIC SYMBOLS
ORDER CODES
74AC202/8
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE X : Don’t Care
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
RECOMMENDED OPERATING CONDITIONS 1) VIN from 30% to 70% of VCC
74AC203/8
DC SPECIFICATIONS 1) Maximum test duration 2ms, one output loaded at time
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50Ω
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 Ω, Input tr = tf = 3ns) (*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ± 0.5V
74AC204/8
CAPACITIVE CHARACTERISTICS 1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/2 (per gate)
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = R1 = 500Ω or equivalent
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM: PROPAGATION DELAYS (f=1MHz; 50% duty cycle)
