74AC00MTR ,QUAD 2-INPUT NAND GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
74AC00MTR ,QUAD 2-INPUT NAND GATEABSOLUTE MAXIMUM RATINGS Symbol Parameter Value UnitV Supply Voltage -0.5 to +7 VCCV DC Input ..
74AC00PC ,Quad 2-Input NAND GateFeaturesThe AC/ACT00 contains four 2-input NAND gates.
74AC00B-74AC00M-74AC00MTR
QUAD 2-INPUT NAND GATE
1/8April 2001 HIGH SPEED: tPD = 4ns (TYP .) at VCC = 5V LOW POWER DISSIPATION:CC = 2μA(MAX.) at TA =25°C HIGH NOISE IMMUNITY:
VNIH = VNIL = 28 % VCC (MIN.) 50Ω TRANSMISSION LINE DRIVING
CAPABILITY SYMMETRICAL OUTPUT IMPEDANCE:OH| = IOL = 24mA (MIN) BALANCED PROPAGATION DELAYS:PLH ≅ tPHL OPERATING VOLTAGE RANGE:
VCC (OPR) = 2V to 6V PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 00 IMPROVED LATCH-UP IMMUNITY
DESCRIPTIONThe 74AC00 is an advanced high-speed CMOS
QUAD 2-INPUT NAND GATE fabricated with
sub-micron silicon gate and double-layer metal
wiring C2 MOS tecnology.
The internal circuit is composed of 3 stages in-
cluding buffer output, which enables high noise
immunity and stable output.
All inputs and outputs are equipped with protec-
tion circuits against static discharge, giving them
2KV ESD immunity and transient excess voltage.
74AC00QUAD 2-INPUT NAND GATE
PIN CONNECTION AND IEC LOGIC SYMBOLS
ORDER CODES
74AC002/8
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
RECOMMENDED OPERATING CONDITIONS 1) VIN from 30% to 70% of VCC
74AC003/8
DC SPECIFICATIONS 1) Maximum test duration 2ms, one output loaded at time
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50Ω
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 Ω, Input tr = tf = 3ns) (*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ± 0.5V
74AC004/8
CAPACITIVE CHARACTERISTICS 1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = R1 = 500Ω or equivalent
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM: PROPAGATION DELAYS (f=1MHz; 50% duty cycle)
