5962-9163901MEA ,CMOS Quad TRI STATE Differential Line DriversFeatures- TTL input compatible - Outputs won't load line when Vcc = 0V - Meets the requirements of ..
5962-9163901MFA ,CMOS Quad TRI STATE Differential Line DriversElectrical Characteristics (Continued)Note1: Absolute Maximum Ratings are those values beyond which ..
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744766220 , SMD-RF-Choke WE-GF
744766220 , SMD-RF-Choke WE-GF
744770015 , POWER-CHOKE WE-PD
74477007 , POWER-CHOKE WE-PD
744770112 , POWER-CHOKE WE-PD
74477110 , POWER-CHOKE WE-PD
5962-9163901MEA
CMOS Quad TRI STATE Differential Line Drivers
Original Creation Date: 01/23/96
Last Update Date: 05/04/01
Last Major Revision Date: 01/23/96
MNDS26C31M-X REV 0B0
MICROCIRCUIT DATA SHEET
CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER
General DescriptionThe DS26C31 is a qual differential line driver designed for digital data transmission over
balanced lines. The DS26C31 meets all the requirements of EIA standard RS-422 while
retaining the low power characteristics of CMOS. This enables the construction of serial
and terminal interfaces while maintaining minimal power consumption.
The DS26C31 accepts TTL or CMOS input levels and translates these to RS-422 output levels.
This part uses special output circuitry that enables the individual drivers to power down
without loading down the bus. This device has enable and disable circuitry common to all
four drivers. The DS26C31 is pin compatible to the AM26LS31 and the DS26LS31.
All inputs are protected against damage due to electrostatic discharge by diodes to Vcc
and ground.
NS Part NumbersDS26C31ME/883
DS26C31MJ/883
DS26C31MW/883
DS26C31MWG/883
Industry Part NumberDS26C31
Prime DieDS26C31
Controlling DocumentSEE FEATURES SECTION
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55