AD586ARZ ,High Precision 5 V ReferenceSPECIFICATIONSA INAD586K/AD586J AD586A AD586L/AD586B AD586M AD586S AD586TParameter Min Typ Max Min ..
AD586ARZ ,High Precision 5 V ReferenceSpecifications subject to change without notice.ABSOLUTE MAXIMUM RATINGS* CONNECTION DIAGRAMV to Gr ..
AD586BR ,High Precision 5 V Referenceapplications.Edges: A diamond saw is used to separate wafers into dice thus providing perpendicular ..
AD586J ,High Precision 5 V Referenceapplications requiring higher precision, an optional fine-pinout, many systems can be upgraded inst ..
AD586JN ,High Precision 5 V ReferenceSPECIFICATIONSA INAD586J AD586K/A AD586L/B AD586M AD586S AD586TModel Min Typ Max Min Typ Max Min Ty ..
AD586JQ ,High Precision 5 V Referencespecifications.the standard on-chip references.The AD586J, K, L and M are specified for operation f ..
AD9814JRRL ,Low Power 14-Bit, 3-Channel CCD Signal Processor with Progammable Serial Interface and Byte-Wide Data Output FormatSPECIFICATIONS (T to T , AVDD = +5 V, DRVDD = +5 V, 3-Channel CDS Mode, f = 6 MHz, f = f =MIN MAX A ..
AD9814KR ,Complete 14-Bit CCD/CIS Signal ProcessorSPECIFICATIONS (T to T , AVDD = +5 V, DRVDD = +5 V)MIN MAXParameter Symbol Min Typ Max UnitsCLOCK P ..
AD9814KR ,Complete 14-Bit CCD/CIS Signal ProcessorAPPLICATIONScally consumes 330 mW of power, and is packaged in a 28-leadFlatbed Document ScannersSO ..
AD9814KR ,Complete 14-Bit CCD/CIS Signal ProcessorSPECIFICATIONS (T to T , AVDD = +5 V, DRVDD = +5 V, 3-Channel CDS Mode, f = 6 MHz, f = f =MIN MAX A ..
AD9816 ,Complete 12-Bit 6 MSPS CCD/CIS Signal ProcessorSPECIFICATIONS (T to T with AVDD = +5.0 V, DVDD = +5.0 V, DRVDD = +5.0 V, CDS Mode, f = 6 MHz,MIN M ..
AD9816JS ,Complete 12-Bit 6 MSPS CCD/CIS Signal ProcessorSPECIFICATIONS (T to T with AVDD = +5.0 V, DVDD = +5.0 V, DRVDD = +5.0 V, CDS Mode, f = 6 MHz,MIN M ..
5962-8982401PA-AD586AR-REEL-AD586ARZ
High Precision 5 V Reference
REV.F
High Precision
5 V Reference
FEATURES
Laser Trimmed to High Accuracy
5.000 V � 2.0 mV (M Grade)
Trimmed Temperature Coefficient
2 ppm/�C Max, 0�C to 70�C (M Grade)
5 ppm/�C Max, –40�C to +85�C (B and L Grades)
10 ppm/�C Max, –55�C to +125�C (T Grade)
Low Noise, 100 nV/√Hz
Noise Reduction Capability
Output Trim Capability
MIL-STD-883 Compliant Versions Available
Industrial Temperature Range SOICs Available
Output Capable of Sourcing or Sinking 10 mA
FUNCTIONAL BLOCK DIAGRAM
GND
VINNOISE REDUCTION
VOUT
TRIM
NOTE: PINS 1, 3, AND 7 ARE INTERNAL TEST POINTS.
MAKE NO CONNECTIONS TO THESE POINTS.
GENERAL DESCRIPTIONThe AD586 represents a major advance in the state-of-the-art in
monolithic voltage references. Using a proprietary ion-implanted
buried Zener diode and laser wafer trimming of high stability
thin-film resistors, the AD586 provides outstanding performance
at low cost.
The AD586 offers much higher performance than most other 5 V
references. Because the AD586 uses an industry-standard pinout,
many systems can be upgraded instantly with the AD586.
The buried Zener approach to reference design provides lower
noise and drift than band gap voltage references. The AD586
offers a noise reduction pin that can be used to further reduce
the noise level generated by the buried Zener.
The AD586 is recommended for use as a reference for 8-, 10-,
12-, 14-, or 16-bit DACs that require an external precision
reference. The device is also ideal for successive approximation
or integrating ADCs with up to 14 bits of accuracy and, in
general, can offer better performance than the standard on-chip
references.
The AD586J, AD586K, AD586L, and AD586M are specified for
operation from 0°C to 70°C; the AD586A and AD586B are
specified for –40°C to +85°C operation; and the AD586S and
AD586T are specified for –55°C to +125°C operation. The
AD586J, AD586K, AD586L, and AD586M are available in an
8-lead PDIP. The AD586J, AD586K, AD586L, AD586A, and
AD586B are available in an 8-lead SOIC package. The AD586J,
AD586K, AD586L, AD586S, and AD586T are available in an
8-lead CERDIP package.
PRODUCT HIGHLIGHTS1. Laser trimming of both initial accuracy and temperature
coefficients results in very low errors over temperature with-
out the use of external components. The AD586M has a
maximum deviation from 5.000 V of ±2.45 mV between 0°C
and 70°C, and the AD586T guarantees ±7.5 mV maximum
total error between –55°C and +125°C.
2. For applications requiring higher precision, an optional fine-trim
connection is provided.
3. Any system using an industry standard pinout reference can
be upgraded instantly with the AD586.
4. Output noise of the AD586 is very low, typically 4 µV p-p. A
noise reduction pin is provided for additional noise filtering
using an external capacitor.
5. The AD586 is available in versions compliant with MIL-
STD- 883. Refer to the Analog Devices Military Products
Databook or the current AD586/883B data sheet for detailed
specifications.
AD586–SPECIFICATIONS(@ TA = 25�C, VIN = 15 V, unless otherwise noted.)LINE REGULATION
NOTESMaximum output voltage drift is guaranteed for all packages and grades. CERDIP packaged parts are also 100°C production tested.Lower row shows specified performance for A and B grades.The operating temperature range is defined as the temperatures extremes at which the device will still function. Parts may deviate from their specified performance
outside their specified temperature range.
Specifications in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All minimum
and maximum specifications are guaranteed, although only those shown in boldface are tested on all production units, unless otherwise specified.
Specifications subject to change without notice.
CONNECTION DIAGRAM
ABSOLUTE MAXIMUM RATINGS*VIN to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 V
Power Dissipation (25°C) . . . . . . . . . . . . . . . . . . . . . 500 mW
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . .300°C
Package Thermal Resistance
�JC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22°C/W
�JA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110°C/W
Output Protection: Output safe for indefinite short to ground
or VIN.
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
CAUTIONESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD586 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
ORDERING GUIDENOTESZ = Pb-free part.For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military
Products Databook or the current AD586/883B data sheet.
AD586
THEORY OF OPERATIONThe AD586 consists of a proprietary buried Zener diode refer-
ence, an amplifier to buffer the output, and several high stability
thin-film resistors as shown in the block diagram in Figure 1.
This design results in a high precision monolithic 5 V output
reference with initial offset of 2.0 mV or less. The temperature
compensation circuitry provides the device with a temperature
coefficient of under 2 ppm/°C.
Using the bias compensation resistor between the Zener output
and the noninverting input to the amplifier, a capacitor can be
added at the NOISE REDUCTION pin (Pin 8) to form a low-
pass filter and reduce the noise contribution of the Zener to
the circuit.
GND
VINNOISE REDUCTION
VOUT
TRIM
NOTE: PINS 1, 3, AND 7 ARE INTERNAL TEST POINTS.
MAKE NO CONNECTIONS TO THESE POINTS.Figure 1. Functional Block Diagram
APPLYING THE AD586The AD586 is simple to use in virtually all precision reference
applications. When power is applied to Pin 2, and Pin 4 is
grounded, Pin 6 provides a 5 V output. No external components
are required; the degree of desired absolute accuracy is achieved
simply by selecting the required device grade. The AD586 requires
less than 3 mA quiescent current from an operating supply of
12 V or 15 V.
An external fine trim may be desired to set the output level to
exactly 5.000 V (calibrated to a main system reference). System
calibration may also require a reference voltage that is slightly
different from 5.000 V, for example, 5.12 V for binary applica-
tions. In either case, the optional trim circuit shown in Figure 2
can offset the output by as much as 300 mV with minimal effect
on other device characteristics.
NOISE PERFORMANCE AND REDUCTIONThe noise generated by the AD586 is typically less than 4 µV p-p
over the 0.1 Hz to 10 Hz band. Noise in a 1 MHz bandwidth is
approximately 200 µV p-p. The dominant source of this noise is
the buried Zener, which contributes approximately 100 nV/√Hz.
By comparison, the op amp’s contribution is negligible. Figure 3
shows the 0.1 Hz to 10 Hz noise of a typical AD586. The noise
measurement is made with a band-pass filter made of a 1-pole
high-pass filter with a corner frequency at 0.1 Hz and a 2-pole
low-pass filter with a corner frequency at 12.6 Hz, to create a
filter with a 9.922 Hz bandwidth.
If further noise reduction is desired, an external capacitor can
be added between the NOISE REDUCTION pin and ground
as shown in Figure 2. This capacitor, combined with the 4 kΩ
RS and the Zener resistances, forms a low-pass filter on the output
of the Zener cell. A 1 µF capacitor will have a 3 dB point at 12 Hz,
and it will reduce the high frequency (to 1 MHz) noise to about
160 µV p-p. Figure 4 shows the 1 MHz noise of a typical AD586
both with and without a 1 µF capacitor.
Figure 3. 0.1 Hz to 10 Hz Noise
Figure 4. Effect of 1 µF Noise Reduction Capacitor
on Broadband Noise
TURN-ON TIMEUpon application of power (cold start), the time required for the
output voltage to reach its final value within a specified error
band is defined as the turn-on settling time. Two components
normally associated with this are: the time for the active circuits
to settle and the time for the thermal gradients on the chip to
stabilize. Figure 5 shows the turn-on characteristics of the AD586.
It shows the settling to be about 60 µs to 0.01%. Note the absence
of any thermal tails when the horizontal scale is expanded to
l ms/cm in Figure 5b.
Output turn-on time is modified when an external noise reduc-
tion capacitor is used. When present, this capacitor acts as an
additional load to the internal Zener diode’s current source,
resulting in a somewhat longer turn-on time. In the case of a
1 µF capacitor, the initial turn-on time is approximately 400 ms
to 0.01% (see Figure 5c).
a. Electrical Turn-On
b. Extended Time Scale
DYNAMIC PERFORMANCEThe output buffer amplifier is designed to provide the AD586
with static and dynamic load regulation superior to less complete
references.
Many ADCs and DACs present transient current loads to the
reference, and poor reference response can degrade the converter’s
performance.
Figures 6a to 6c display the characteristics of the AD586 output
amplifier driving a 0 mA to 10 mA load.
Figure 6a. Transient Load Test Circuit
Figure 6b. Large-Scale Transient Response
Figure 6c. Fine-Scale Setting for Transient Load
AD586In some applications, a varying load may be both resistive and
capacitive in nature, or the load may be connected to the AD586
by a long capacitive cable.
Figures 7a to 7b display the output amplifier characteristics
driving a 1000 pF, 0 mA to 10 mA load.
Figure 7a. Capacitive Load Transient Response
Test Circuit
Figure 7b. Output Response with Capacitive Load
LOAD REGULATIONThe AD586 has excellent load regulation characteristics. Figure 8
shows that varying the load several mA changes the output by a
few µV. The AD586 has somewhat better load regulation per-
formance sourcing current than sinking current.
Figure 8. Typical Load Regulation Characteristics
TEMPERATURE PERFORMANCEThe AD586 is designed for precision reference applications where
temperature performance is critical. Extensive temperature testing
ensures that the device’s high level of performance is maintained
over the operating temperature range.
Some confusion exists in the area of defining and specifying
references (such as “S” type characteristics), most manufactur-
ers have begun to use a maximum limit error band approach to
specify devices. This technique involves measuring the output
at three or more different temperatures to specify an output
voltage error band.
Figure 9 shows the typical output voltage drift for the AD586L
and illustrates the test methodology. The box in Figure 9 is
bounded on the sides by the operating temperature extremes
and on the top and the bottom by the maximum and minimum
output voltages measured over the operating temperature range.
The slope of the diagonal drawn from the lower left to the
upper right corner of the box determines the performance
grade of the device.
Figure 9. Typical AD586L Temperature Drift
Each AD586J, AD586K, and AD586L grade unit is tested at
0°C, 25°C, and 70°C. Each AD586SQ and AD586TQ grade
unit is tested at –55°C, +25°C, and +125°C. This approach
ensures that the variations of output voltage that occur as the
temperature changes within the specified range will be con-
tained within a box whose diagonal has a slope equal to the
maximum specified drift. The position of the box on the vertical
scale will change from device to device as initial error and the
shape of the curve vary. The maximum height of the box for the
appropriate temperature range and device grade is shown in
Table I. Duplication of these results requires a combination of
high accuracy and stable temperature control in a test system.
Evaluation of the AD586 will produce a curve similar to that in
Figure 9, but output readings could vary depending on the test
methods and equipment used.
Table I. Maximum Output Change in mVAD586J
AD586K
AD586L
AD586M
AD586A
