54F11DMQB. ,Triple 3-Input AND GateGeneral DescriptionThis device contains three independent gates, each of which performs the logic A ..
54F11FMQB ,Triple 3-Input AND Gate54F/74F1154F/74F11 Triple 3-Input AND GateDecember 199454F/74F11Triple 3-Input AND Gate
54F138 ,1-of-8 Decoder/DemultiplexerFeaturesYDemultiplexing capabilityThe ’F138 is a high-speed 1-of-8 decoder/demultiplexer.YThis devi ..
54F138 ,1-of-8 Decoder/Demultiplexer54F/74F1381-of-8Decoder/DemultiplexerNovember199454F/74F1381-of-8Decoder/DemultiplexerGeneralDescri ..
54F138DM ,1-of-8 Decoder/DemultiplexerFeaturesYDemultiplexing capabilityThe ’F138 is a high-speed 1-of-8 decoder/demultiplexer.YThis devi ..
54F138DMQB ,1-of-8 Decoder/DemultiplexerMILITARY DATA SHEETOriginal Creation Date: 03/14/96MN54F138-X REV 1A0Last Update Date: 07/30/96Last ..
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6B11 ,Thermocouple Inputs: mV/Volt Inputs: Current Input: Signal Conditioning ModuleGENERAL DESCRIPTION +15mV to +5V as well as 0 to +20mA process current inputs. The 6B11 and 6B11HV ..
6B12 ,Single Channel Signal Conditioning ModuleGENERAL DESCRIPTION the 6B12 and 6B12HV modules for address, input range, baud The 6B12 and 6B12HV ..
6B13 ,2-, 3-, 4-wire RTD Inputs: Signal Conditioning ModuleGENERAL DESCRIPTION RTDs) is supplied by a tracking pair of current sources. The The 6B13 and 6B13 ..
6B21 ,Isolated Current Output: Signal Conditioning ModuleGENERAL DESCRIPTION through an RS-485 port to exchange command and status The 6B21 is a single-cha ..
54F11DMQB-54F11DMQB.
Triple 3-Input AND Gate
Original Creation Date: 03/07/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/07/96
MN54F11-X REV 1A0
MILITARY DATA SHEET
TRIPLE 3 INPUT AND GATE
General DescriptionThis device contains three independent gates, each of which performs the logic AND
function.
NS Part Numbers54F11DMQB
54F11FMQB
54F11LMQB
Industry Part Number54F11
Prime DieM011
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
