54F109DMQB ,Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-FlopGeneral DescriptionThe F109 consists of two high-speed, completely independent transition clockedJK ..
54F10DM ,Triple 3-Input NAND Gate
54F10DMQB ,Triple 3-Input NAND GateGeneral DescriptionThis device contains four independent gates, each of which performs the logic NA ..
54F10DMQB ,Triple 3-Input NAND Gate
54F10DMQB ,Triple 3-Input NAND Gate
54F10DMQB ,Triple 3-Input NAND GateMILITARY DATA SHEETOriginal Creation Date: 03/07/96MN54F10-X REV 1A0Last Update Date: 07/30/96Last ..
699-3-R10KB , Dual In-Line Precision Thin Film Resistor Networks
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6B11 ,Thermocouple Inputs: mV/Volt Inputs: Current Input: Signal Conditioning ModuleGENERAL DESCRIPTION +15mV to +5V as well as 0 to +20mA process current inputs. The 6B11 and 6B11HV ..
6B12 ,Single Channel Signal Conditioning ModuleGENERAL DESCRIPTION the 6B12 and 6B12HV modules for address, input range, baud The 6B12 and 6B12HV ..
6B13 ,2-, 3-, 4-wire RTD Inputs: Signal Conditioning ModuleGENERAL DESCRIPTION RTDs) is supplied by a tracking pair of current sources. The The 6B13 and 6B13 ..
54F109DMQB
Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-Flop
Original Creation Date: 03/13/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/13/96
MN54F109-X REV 1A0
MILITARY DATA SHEET
DUAL JK POSITIVE EDGE-TRIGGERED FLIP-FLOP
General DescriptionThe F109 consists of two high-speed, completely independent transition clocked
JK flip-flops. The clocking operation is independent of rise and fall times of the clock
waveform. The JK design allows operation as a D flip-flop (refer to F74 data sheet) by
connecting the J and K inputs.
Asynchronous Inputs:
LOW input to SD sets Q to HIGH level
LOW input to CD sets Q to LOW level
Clear and Set are independent of clock
Simultaneous LOW on CD and SD makes both Q and Q HIGH
NS Part Numbers54F109DM
54F109DMQB
54F109FMQB
54F109LMQB
Industry Part Number54F109
Prime DieM109
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
