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54F109DMQBNSN/a100avaiDual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-Flop


54F109DMQB ,Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-FlopGeneral DescriptionThe F109 consists of two high-speed, completely independent transition clockedJK ..
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54F10DMQB ,Triple 3-Input NAND GateMILITARY DATA SHEETOriginal Creation Date: 03/07/96MN54F10-X REV 1A0Last Update Date: 07/30/96Last ..
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54F109DMQB
Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-Flop
Original Creation Date: 03/13/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/13/96MN54F109-X REV 1A0
MILITARY DATA SHEET
DUAL JK POSITIVE EDGE-TRIGGERED FLIP-FLOP
General Description

The F109 consists of two high-speed, completely independent transition clocked
JK flip-flops. The clocking operation is independent of rise and fall times of the clock
waveform. The JK design allows operation as a D flip-flop (refer to F74 data sheet) by
connecting the J and K inputs.
Asynchronous Inputs:
LOW input to SD sets Q to HIGH level
LOW input to CD sets Q to LOW level
Clear and Set are independent of clock
Simultaneous LOW on CD and SD makes both Q and Q HIGH
NS Part Numbers

54F109DM
54F109DMQB
54F109FMQB
54F109LMQB
Industry Part Number

54F109
Prime Die

M109
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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