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54F08FMQB ,Quad 2-Input AND GateGeneral DescriptionThis device contains four independent gates, each of which performs the logic AN ..
54F10 ,Triple 3-Input NAND Gate
54F10 ,Triple 3-Input NAND Gate
54F109DC ,Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-FlopFeaturesAsynchronous Inputs:n Guaranteed 4000V minimum ESD protection.LOW input to S sets Q to HIGH ..
54F109DMQB ,Dual JK (Note: Overbar Over the K) Positive Edge-Triggered Flip-FlopGeneral DescriptionThe F109 consists of two high-speed, completely independent transition clockedJK ..
54F10DM ,Triple 3-Input NAND Gate
699-3-R10KB , Dual In-Line Precision Thin Film Resistor Networks
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6B11 ,Thermocouple Inputs: mV/Volt Inputs: Current Input: Signal Conditioning ModuleGENERAL DESCRIPTION +15mV to +5V as well as 0 to +20mA process current inputs. The 6B11 and 6B11HV ..
6B12 ,Single Channel Signal Conditioning ModuleGENERAL DESCRIPTION the 6B12 and 6B12HV modules for address, input range, baud The 6B12 and 6B12HV ..
6B13 ,2-, 3-, 4-wire RTD Inputs: Signal Conditioning ModuleGENERAL DESCRIPTION RTDs) is supplied by a tracking pair of current sources. The The 6B13 and 6B13 ..
54F08DMQB-54F08FMQB-JM38510/34001BCA
Quad 2-Input AND Gate
Original Creation Date: 03/06/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/06/96
MN54F08-X REV 1A0
MILITARY DATA SHEET
QUAD 2 INPUT AND GATE
General DescriptionThis device contains four independent gates, each of which performs the logic AND
function.
NS Part Numbers54F08DMQB
54F08FMQB
54F08LMQB
Industry Part Number54F08
Prime DieM008
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55