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SN74LVTH18512 from TI,Texas Instruments

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SN74LVTH18512

Manufacturer: TI

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Partnumber Manufacturer Quantity Availability
SN74LVTH18512 TI 300 In Stock

Description and Introduction

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers The SN74LVTH18512 is a 3.3-V, 18-bit universal bus transceiver manufactured by Texas Instruments (TI).  

### **Key Specifications:**  
- **Supply Voltage (VCC):** 3.3 V ± 0.3 V  
- **Logic Family:** LVT (Low-Voltage BiCMOS Technology)  
- **Number of Bits:** 18  
- **I/O Type:** 5V Tolerant Inputs and Outputs  
- **Operating Temperature Range:** -40°C to +85°C  
- **Package Options:** 56-pin SSOP, TSSOP  

### **Descriptions and Features:**  
- **Universal Bus Transceiver:** Combines D-type latches and D-type flip-flops for flexible data transfer.  
- **Bidirectional Data Flow:** Supports independent control for A-to-B or B-to-A data transfer.  
- **Output Enable (OE) Inputs:** Disables outputs when high, reducing power consumption.  
- **Latch Enable (LE) Inputs:** Controls data storage in latches.  
- **Clock (CLK) Inputs:** Controls data transfer to flip-flops.  
- **Bus-Hold Data Inputs:** Eliminates the need for external pull-up/pull-down resistors.  
- **High Drive Outputs:** ±24 mA at 3.3 V.  
- **ESD Protection:** Exceeds 2000 V per JESD 22 (Human Body Model).  

This device is designed for high-performance, low-power applications in mixed-voltage systems.

Application Scenarios & Design Considerations

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

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