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SN74LVTH182512DGGR from TI,Texas Instruments

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SN74LVTH182512DGGR

Manufacturer: TI

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Partnumber Manufacturer Quantity Availability
SN74LVTH182512DGGR TI 1617 In Stock

Description and Introduction

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers The SN74LVTH182512DGGR is a 3.3-V ABT 18-bit universal bus transceiver manufactured by Texas Instruments (TI).  

### **Key Features:**  
- **Voltage Supply:** 3.3V  
- **Logic Type:** Universal Bus Transceiver  
- **Number of Bits:** 18  
- **Technology:** ABT (Advanced BiCMOS Technology)  
- **Operating Temperature Range:** -40°C to 85°C  
- **Package Type:** TSSOP (Thin Shrink Small Outline Package)  
- **Pin Count:** 56  
- **Data Rate:** High-speed operation (specific speed depends on conditions)  
- **I/O Type:** 3.3V TTL-compatible inputs and outputs  
- **Bus-Hold Feature:** Retains last state when inputs are floating  
- **Output Drive:** Supports live insertion  

### **Description:**  
The SN74LVTH182512DGGR is designed for bidirectional data transfer between buses operating at different voltage levels. It integrates 18-bit transceivers with direction control, making it suitable for applications requiring high-speed data transmission while maintaining signal integrity.  

Would you like additional details on pin configuration or electrical characteristics?

Application Scenarios & Design Considerations

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

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