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SN74LVT8996DW from TI,Texas Instruments

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SN74LVT8996DW

Manufacturer: TI

3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver

Partnumber Manufacturer Quantity Availability
SN74LVT8996DW TI 125 In Stock

Description and Introduction

3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver The SN74LVT8996DW is a 10-bit registered transceiver manufactured by Texas Instruments (TI).  

### **Specifications:**  
- **Logic Type:** Registered Transceiver  
- **Number of Bits:** 10  
- **Voltage Supply:** 3V to 3.6V (LVTTL/LVCMOS compatible)  
- **Operating Temperature Range:** -40°C to +85°C  
- **Package Type:** SOIC (DW)  
- **Output Type:** 3-State  
- **Data Rate:** High-speed operation (specific speed depends on conditions)  
- **Input/Output Compatibility:** 5V tolerant inputs  

### **Descriptions:**  
The SN74LVT8996DW is designed for bidirectional data transfer between buses. It features registered inputs and outputs, ensuring synchronous operation. The device supports 3-state outputs for bus-oriented applications.  

### **Features:**  
- **Bidirectional Data Flow:** Allows data transfer in both directions.  
- **Registered Inputs/Outputs:** Ensures synchronous operation.  
- **3-State Outputs:** Enables bus sharing.  
- **5V-Tolerant Inputs:** Allows interfacing with 5V logic signals.  
- **Low-Power Consumption:** Optimized for 3.3V operation.  
- **Flow-Through Pinout:** Simplifies PCB layout.  

For detailed electrical characteristics and timing diagrams, refer to the official TI datasheet.

Application Scenarios & Design Considerations

3.3-V ABT 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) TAP Transceiver

Alternative Part Number

  • 74LVT8996PW --: Same LVT 10-bit scan-test device function in a TSSOP package from a different vendor, suitable as a functional drop-in with package adaptation.
  • 74LVT8996DGG --: Equivalent LVT scan-test transceiver in TSSOP-56, offering the same boundary-scan capability with a different package option.
  • SN74ABT8996DW --: ABT-series scan-test device with similar 10-bit scan support and SOIC-56 footprint, usable where slightly different speed/power characteristics are acceptable.

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