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SN74AS10NSR from TEXAS

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SN74AS10NSR

Manufacturer: TEXAS, TI

Triple 3-Input Positive-NAND Gates

Partnumber Manufacturer Quantity Availability
SN74AS10NSR TEXAS, TI 680 In Stock

Description and Introduction

Triple 3-Input Positive-NAND Gates The SN74AS10NSR is a triple 3-input positive-NAND gate manufactured by Texas Instruments (TI).  

### **Specifications:**  
- **Logic Type:** NAND Gate  
- **Number of Circuits:** 3  
- **Number of Inputs per Gate:** 3  
- **Supply Voltage Range:** 4.5V to 5.5V  
- **Propagation Delay (Max):** 7.5 ns at 5V  
- **Operating Temperature Range:** 0°C to 70°C  
- **Package / Case:** SOIC-14  
- **Mounting Type:** Surface Mount  
- **Output Type:** Push-Pull  
- **High-Level Output Current:** -15 mA  
- **Low-Level Output Current:** 48 mA  

### **Descriptions & Features:**  
- **Triple 3-Input NAND Gate:** Contains three independent NAND gates, each with three inputs.  
- **AS Series:** Part of TI's Advanced Schottky (AS) logic family, offering improved speed and power efficiency.  
- **Wide Operating Voltage:** Supports standard TTL voltage levels (4.5V to 5.5V).  
- **High-Speed Operation:** Optimized for fast switching applications.  
- **Surface-Mount Package:** SOIC-14 package suitable for compact PCB designs.  
- **TTL-Compatible Inputs:** Ensures compatibility with standard TTL logic levels.  
- **Push-Pull Outputs:** Provides strong drive capability for both high and low logic levels.  

This device is commonly used in digital logic applications requiring multiple NAND gate functions.

Application Scenarios & Design Considerations

Triple 3-Input Positive-NAND Gates

Alternative Part Number

  • 74AC10SC --: Triple 3-input NAND gate in SOIC-14 with similar speed and drive, direct functional replacement for the AS10 logic.
  • MC74HC10ADG --: Triple 3-input NAND in SOIC-14, lower power CMOS alternative suitable when reduced power is acceptable.
  • CD74ACT10M --: Triple 3-input NAND in SOIC-14 with TTL-compatible inputs, close electrical match from the same vendor family.

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