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SCANPSC100FSC from NSC,National Semiconductor

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SCANPSC100FSC

Manufacturer: NSC, NS

Embedded Boundary Scan Controller
Partnumber Manufacturer Quantity Availability
SCANPSC100FSC NSC, NS 166 In Stock

Description and Introduction

Embedded Boundary Scan Controller The SCANPSC100FSC is a product manufactured by NSC (National Semiconductor Corporation). Below are the factual details from Ic-phoenix technical data files:

### **Specifications:**
- **Manufacturer:** NSC (National Semiconductor Corporation)  
- **Part Number:** SCANPSC100FSC  
- **Type:** ScanPSC (Programmable System Chip)  

### **Descriptions and Features:**
- **Programmable System Chip:** Designed for flexible system integration and configuration.  
- **High-Speed Operation:** Optimized for performance in embedded applications.  
- **Low Power Consumption:** Suitable for power-sensitive designs.  
- **Integrated Logic:** Combines programmable logic with system-level functions.  
- **Wide Operating Voltage Range:** Supports various power supply conditions.  
- **Compact Package:** Designed for space-constrained applications.  

For exact electrical characteristics, pin configurations, or application notes, refer to the official NSC datasheet or product documentation.

Application Scenarios & Design Considerations

Embedded Boundary Scan Controller

Alternative Part Number

  • PSC100FSC --: Same PSC100 function and pinout, TI acquired National Semiconductor and continues to support this bus controller family.
  • SCANPSC110FSC --: Next-generation SCAN PSC110 controller from the same family with compatible interface and enhanced features.
  • PSC100FSCX --: Tape-and-reel variant of the same PSC100 die, electrically identical and suitable as a drop-in replacement.
  • SN74BCT8244AFN --: Boundary-scan test bus transceiver from TI's SCOPE octal scan family, offering comparable IEEE 1149.1 scan-path support for board-level test applications.
  • SN74ABT8245DWR --: SCOPE octal boundary-scan transceiver with JTAG support in a wide-body SOIC package, suitable as a functional substitute where scan-path testing is required.

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