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TPC8066-H |TPC8066HToshibaN/a30000avaiPower MOSFET (N-ch single VDSS≤30V)


TPC8066-H ,Power MOSFET (N-ch single VDSS≤30V)
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TPC8066-H
Power MOSFET (N-ch single VDSS≤30V)
TPC8066-H
MOSFETs Silicon N-Channel MOS (U-MOS-H)
TPC8066-HTPC8066-HTPC8066-HTPC8066-H
1. 1. 1. 1. ApplicationsApplicationsApplicationsApplications High-Efficiency DC-DC Converters Notebook PCs Mobile Handsets
2. 2. 2. 2. FeaturesFeaturesFeaturesFeatures
(1) Small, thin package
(2) High-speed switching
(3) Small gate charge: QSW = 3.2 nC (typ.)
(4) Low drain-source on-resistance: RDS(ON) = 15 mΩ (typ.) (VGS = 4.5 V)
(5) Low leakage current: IDSS = 10 µA (max) (VDS = 30 V)
(6) Enhancement mode: Vth = 1.3 to 2.3 V (VDS = 10 V, ID = 0.1 mA)
3. 3. 3. 3. Packaging and Internal CircuitPackaging and Internal CircuitPackaging and Internal CircuitPackaging and Internal Circuit
4. 4. 4. 4. Absolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (Taaa a = 25 = 25 = 25 = 25  unless otherwise specified) unless otherwise specified) unless otherwise specified) unless otherwise specified)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
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