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MAX9176EUB from MAXIM, MAXIM - Dallas Semiconductor 4pcs , MSSOP,670MHz LVDS-to-LVDS and Anything-to-LVDS 2:1 Multiplexers
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MAX9176EUB MAXIM N/a 4
Applications Ordering InformationProtection SwitchingPART TEMP RANGE PIN-PACKAGELoopbackMAX9176EUB -40°C to +85°C 10 µMAXClock DistributionMAX9176ETB* -40°C to +85°C 10 Thin QFN-EP**MAX9177EUB -40°C to +85°C 10 µMAXMAX9177ETB* -40°C to +85°C 10 Thin QFN-EP**Functional Diagram appears at end of data sheet.*Future product—contact factory for availability.**EP = Exposed paddle.Pin ConfigurationsTOP VIEWIN0+ 1 10 IN0+ 1 10 OUT+OUT+2 INO- 2 9 OUT-INO- 9 OUT-EXPOSEDMAX9176GND 3 8 VGND 3 8 V CCCCPADIN1+ 4 7 PDIN1+ 4 7 PDIN1- 5 6 SELIN1- 5 6 SELQFNµ MAX(LEADS UNDER PACKAGE) ____ Maxim Integrated Products 1For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at 1-888-629-4642, or visit Maxim’s website at .670MHz LVDS-to-LVDS and Anything-to-LVDS 2:1 MultiplexersABSOLUTE MAXIMUM RATINGSV to GND.....-0.3V to +4.0V Operating Temperature Range -40°C to +85°CCCIN_+, IN_- to GND ....-0.3V to +4.0V Maximum Junction Temperature .+150°COUT+, OUT- to GND -0.3V to +4.0V Storage Temperature Range ..-65°C to +150°CPD, SEL to GND .....-1.4V to (V + 1.4V) ESD ProtectionCCSingle-Ended and Differential Output Human Body Model (R = 1.5kΩ , C = 100pF)D SShort-Circuit Duration (OUT+, OUT-)....Continuous (IN_+, IN_-, OUT+, OUT-) ..+16kVContinuous Power Dissipation (T = +70°C) IEC61000-4-2 Level 4 (R = 330Ω , C = 150pF)A D S10-Pin µMAX (derate 5.6mW/°C above +70°C) ...444mW Contact Discharge (IN_+, IN_-, OUT+, OUT-)........+8 kV10-Lead Thin QFN (derate 24.4mW/°C above +70°C)..1951mW Air-Gap Discharge (IN_+, IN_-, OUT+, OUT-).......+15kVLead Temperature (soldering, 10s) ......+300°CStresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functionaloperation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure toabsolute maximum rating conditions for extended periods may affect device reliability.DC

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