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LMC6464BINN/a10avaiQuad Micropower, Rail-to-Rail Input and Output CMOS Operational Amplifier
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LMC6464BIMXNSN/a1950avaiQuad Micropower, Rail-to-Rail Input and Output CMOS Operational Amplifier


LMC6464BIMX ,Quad Micropower, Rail-to-Rail Input and Output CMOS Operational AmplifierGeneral DescriptionThe LMC6464 is a quad low offset voltage amplifier, combining rail-to-rail Input ..
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LMC6464BIN ,Quad Micropower, Rail-to-Rail Input and Output CMOS Operational AmplifierMICROCIRCUIT DATA SHEETOriginal Creation Date: 04/03/96MNLMC6464AM-X REV 1A1Last Update Date: 05/19 ..
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LMC6464AIM-LMC6464AIN-LMC6464BIM-LMC6464BIMX-LMC6464BIN
Quad Micropower, Rail-to-Rail Input and Output CMOS Operational Amplifier
Original Creation Date: 04/03/96
Last Update Date: 05/19/98
Last Major Revision Date: 02/08/98MNLMC6464AM-X REV 1A1
MICROCIRCUIT DATA SHEET
PRECISION CMOS QUAD MICROPOWER OPERATIONAL AMPLIFIER
General Description

The LMC6464 is a quad low offset voltage amplifier, combining rail-to-rail Input and
Output Range with very low power consumption. Performance characteristics include low
input bias current, high voltage gain, rail-to-rail output swing, and an input common mode
voltage range that exceeds both rails, operating at 3V, 5V, and 15V. The rail-to-rail
output swing of the amplifier, for loads down to 25 KOhms, assures maximum dynamic signal
range. These features, plus its low power consumption, make the LMC6464 ideally suited for
battery powered applications.
The LMC6464 is an excellent upgrade for circuits using limited common-mode range
amplifiers.
For designs that require higher speed, see the LMC6484 quad operational amplifier.
NS Part Numbers

LMC6464AMJ-QML
LMC6464AMWG-QML*
Industry Part Number

LMC6464
Prime Die

LMC6464
Controlling Document

5962-9560302QCA,QXA*
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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