LM2991T ,Negative Low Dropout Adjustable RegulatorMICROCIRCUIT DATA SHEETOriginal Creation Date: 09/06/95MNLM2991-X REV 1A1Last Update Date: 09/22/00 ..
LM299H ,Precision Reference
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LM301A ,Product informationfeatures: supply voltagesfrom ±5V to ±22V, low current drain, overload pro- DSO8tection on the inpu ..
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LM94021BIMG ,?1.5?C Temperature Sensor with Multiple Gain Analog Output Options 5-SC70 -50 to 150FEATURES DESCRIPTIONThe LM94021 is a precision analog output CMOS2• LM94021Q is AEC-Q100 Grade 0 Qu ..
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LM2991S-LM2991SX-LM2991T
Negative Low Dropout Adjustable Regulator
Original Creation Date: 09/06/95
Last Update Date: 09/22/00
Last Major Revision Date: 08/16/00
MNLM2991-X REV 1A1
MICROCIRCUIT DATA SHEET
NEGATIVE LOW DROPOUT ADJUSTABLE REGULATOR
General DescriptionThe LM2991 is a low dropout adjustable negative regulator with a output voltage range
between -2V to -25V. The LM2991 provides up to 1A of load current and features a ON/Off
pin for remote shutdown capability.
The LM2991 uses new circuit design techniques to provide a low dropout voltage, low
quiescent current and low temperature coefficient precision reference. The dropout voltage
at 1A load current is typically 0.6V and a guaranteed worst-case maximum of 1V over the
entire operating temperature range. The quiescent current is typically 1mA with a 1A load
current and an input-output voltage differential greater than 3V. A unique circuit design
of the internal bias supply limits the quiescent current to only 9mA (typical) when the
regulator is in the dropout mode (Vout - Vin < 3V).
The LM2991 is short-circuit proof, and thermal shutdown includes hysteresis to enhance the
reliability of the device when inadvertently overloaded for extended periods.
NS Part NumbersLM2991J-QML
LM2991J-QMLV
LM2991WG-QML
Industry Part NumberLM2991
Prime DieLM2991
Controlling DocumentSEE FEATURES SECTION
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
