LM199AH ,Precision Referenceapplications are analog to digital converters, calibrationstandards, precision voltage or current s ..
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LM199AH
Precision Reference
Original Creation Date: 08/15/95
Last Update Date: 02/24/03
Last Major Revision Date: 08/15/95
MNLM199A-X REV 0CL
MICROCIRCUIT DATA SHEET
PRECISION VOLTAGE REFERENCE
General DescriptionThe LM199 are precision, temperature-stabilized monolithic zeners offering temperature
coefficients a factor of ten better than high quality reference zeners. Constructed on a
single monolithic chip is a temperature stabilizer circuit and an active reference zener.
The active circuitry reduces the dynamic impedance of the zener to about 0.5ohms and
allows the zener to operate over 0.5 mA to 10 mA current range with essentially no change
in voltage or temperature coefficient. Further, a new subsurface zener structure gives low
noise and excellent long term stability compared to ordinary monolithic zeners. The
package is supplied with a thermal shield to minimize heater power and improve temperature
regulation.
The LM199 references are exceptionally easy to use and free of the problems that are often
experienced with ordinary zeners. There is virtually no hysteresis in reference voltage
with temperature cycling. Also, the LM199 is free of voltage shift due to stress on the
leads. Finally, since the unit is temperature stabilized, warm up time is fast.
The LM199 can be used in almost any application in place of ordinary zeners with improved
performance. Some ideal applications are analog to digital converters, calibration
standards, precision voltage or current sources or precision power supplies. Further in
many cases the LM199 can replace references in existing equipment with a minimum of wiring
changes.
The LM199 series devices are packaged in a standard hermetic To-46 package inside a
thermal shield. The LM199 is rated for operation from -55 C to +125 C.
NS Part NumbersLM199AH-SMD*
LM199AH/883
Industry Part NumberLM199
Prime DieLM199
Controlling Document5962-8856101XA*
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
