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IRFK4H450IRN/a5avai500V SINGLE HEXFET Power MOSFET in a TO-240AA package
IRFK4H450+ |IRFK4H450IRN/a42avai500V SINGLE HEXFET Power MOSFET in a TO-240AA package


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IRFK4H450-IRFK4H450+
500V SINGLE HEXFET Power MOSFET in a TO-240AA package
Bulletin E27107
Ilrtternatiorttil
Isak Rectifier IRFK4H450,IRFK4J450
Isolated Base Power HEX-pakTM Assembly - Parallel Chip Configuration
High Current Capability.
UL recognised E78996.
Electrically Isolated Base Plate.
Easy Assembly into Equipment.
Description
The HEX-pakm utilises the well-proven HEXFETTM die, combining V - 500V
low on-state resistance with high transconductance. These superior DS -
technology die are assembled by state of the art techniques into the
TO-240 package, featuring 2.5kV rms isolation and solid M5 screw RDS(on) = 100mg
connections. The small footprint means the package is highly suited to
power applications where space is a premium. Available in two
versions, IRFK.H... for fast switching and IRFK.J... for oscillation ID = 44A
sensitive applications.
Absolute Maximum Rating
Parameter Max. , Units
b © Tc=25°C Continuous Drain Current 41 i A
TE; @Tg=_16030_ _ -cairJou-s-rrrainlrGt- 28 A --1
bu Pulse Drain Current 176 A (D
PD @ Tc---250C Maximum Power Dissipation 500 W
VGS Gate-to-Source Voltage 20 V
VINS R.M.S. Isolation Voltage, circuit to base 25 W
T J Operating Junction Temperature Range T -40 to 150 oc
TSTG Storage Temperature Range -40 to 150 T H _ - 8C
Thermal and Mechanical Specifications
T| Parameter I Min. Typ. Max. Units
Rmuc Junction-to-Case , - - 0.25 K/W ©
RthCS Case-to-Sink, smooth 8. greased surface - 0.1 _ - W
T N Mounting Torque +10% Jr"
HEXpak to Heatsink - 5 - Nm
Busbar to H_E)fek_, - - 3 - 1 Nmtu
wt Approximate Weight - 140 - g
- 5 - ----i, 02 t
Notes:
OD - Repetitive Rating: Pulse width limited by maximum junction temperature see figure 8.
© - Per Module.
© - A mounting compound is recommended and the torque should be rechecked after a period of three
hours to allow for the spread of the compound.
IRFK4H450,lRFK4J450
Electrical Characteristics tii) T J = 25°C (Unless otherwise specified)
- - Parameter - Min. Typ. I Max. Units Test Conditions
Bvoss Drain-to-Source Breakdown 500 - l - V VGS=OV, |D=1.0mA
\Loltage l
RDS(an) Static Drain-to-Source - 80 I 100 mn VGS=10V, ID=14A
ChntattystLs_ta_le, l
IMO") On-State Drain Current 44 - I - A Vos > ‘D(on) It RDS(0n)max,
VGS=10V
VGS(th) Gate Threshold Voltage 2.0 - 4.0 V Vas-Ass, b--1.0mA
gfs Forward TransconductancTqT 32 52 - 1 S VDS > 50v, ID=28A
IDSS Zero Gate Voltage Drain Current - - 1.0 mA VDS=VDSmax, Vss=tht
4.0 mA VGS=1ov, TC=125°C,
VDS=VDSmax x 0.8
IGSS Gate-to-Source Leakage Forward - - 400 nA VGS=20V
|GSS Gate-to-Source Leakage Reverse - - L -400 nA Vss---20V
09 Total Gate Charge - 420 520 nC b=44A, VGS=1OV,
095 Gate-to-Source Charge l - 45 70 nC VDS=VDsmax x 0.8
di Gate-to-Drain ("Miller") Charge l - 175 260 nC
tdwnl Turn-on Delay Time IRFK4H054 f - 110 - ns VDD=25V, b=150A,
IRFK4J054 l - 125 - ns
Rise Time IRFK4H054 - 700 - - ns VGS=10V,
- IRFK4J054 - 800 -____ns__
Turn-off Delay Time JRFK4HO54 " - 400 - __ns__ Rsounar-3.3n
- - - _ _ _ - - |RFK4J054 1 - 530 - ns
1, Fall Time - IRFK4H054 - 260 - ns
1RFK4J054 - 300 - ns
Los Drain-to-Source Inductance - 18 - nH
Ciss Input Capacitance_ - _ - - 10.5 _ nF Vss=0V, VDS=25V,
Coss Output Capacitance - 2.4 . nF f=1.0MHz
Crss Reverse Transfer Capacitance - 1.0 - nF
VIN; l R.M.S. Isolation Voltage 1 2.5 - - kV Circuit to Base
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
Is Continuous Source Current - - - 44 A
(Body Diode)
ISM Pulsed Source Current - - 165 A
(Body Diode)
Vso Diode Forward Voltage - _ 1.4 V VGS=0V, IS: 44A, TC=25°C
T" Reverse Recovery Time 280 580 1200 ns di/dt=400A/ps, T £15000
O, I Reverse Recovered Charge 13.0 27.0 65.0 PC IS=44A
Notes:
69 - Pulse Width s: 300gs; Duty cycle s: 2%.
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