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HCF4081STN/a914avaiDUAL 4 INPUT AND GATE
HCF4081ST ?N/a6avaiDUAL 4 INPUT AND GATE


HCF4081 ,DUAL 4 INPUT AND GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4081 ,DUAL 4 INPUT AND GATEHCF4081BQUAD 2 INPUT AND GATE

HCF4081
DUAL 4 INPUT AND GATE
1/8March 2004 MEDIUM SPEED OPERATION:
tPD= 60ns (Typ.)at 10V QUIESCENT CURRENT SPECIFIED UP TO
20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT= 100nA (MAX)AT VDD =18VTA= 25°C 100% TESTED FOR QUIESCENT CURRENT
DESCRIPTION

The HCF4081Bisa monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology availablein DIP and SOP packages.
The HCF4081B QUAD2 INPUT AND GATE
provide the system designer with direct
implementation of the AND function and
supplement the existing familyof CMOS gates.
HCF4081B

QUAD2 INPUT AND GATE
PIN CONNECTION
ORDER CODES
HCF4081B
2/8
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS

AbsoluteMaximum Ratingsare those values beyond which damagetothe device mayoccur.Functional operation under these conditionsis
not implied.
All voltage valuesare referredto VSSpin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF4081B
3/8 SPECIFICATIONS
The Noise Marginfor both"1"and"0" levelis:1V min. with VDD=5V,2V min. with VDD=10V, 2.5V min. with VDD=15V
DYNAMIC ELECTRICAL CHARACTERISTICS
(T amb= 25°C,CL= 50pF,RL= 200KΩ,tr=tf =20ns)
(*) Typical temperature coefficientforall VDD valueis 0.3%/°C.
HCF4081B
4/8
TEST CIRCUIT
= 50pFor equivalent (includesjig and probe capacitance) =200KΩ =ZOUTof pulse generator (typically 50Ω)
WAVEFORM: PROPAGATION DELAY TIMES
(f=1MHz; 50% duty cycle)


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