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DAC7551IDRNT from TI, Texas Instruments 1pcs,12-BIT, ULTRALOW GLITCH, VOLTAGE OUTPUT DIGITAL-TO-ANALOG CONVERTER
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DAC7551IDRNT TI N/a 1
ELECTRICAL CHARACTERISTICSall specifications at –40°C to +105°C, V = 2.7V to 5.5V, V H = V , V L = GND, R = 2kΩ to GND, and C = 200pF toDD REF DD REF L LGND (unless otherwise noted).PARAMETER TEST CONDITIONS MIN TYP MAX UNITS(1)STATIC PERFORMANCEResolution 12 BitsRelative accuracy ±0.35 ±1 LSBDifferential nonlinearity Specified monotonic by design ±0.08 ± 0.5 LSBOffset error ±12 mVZero-scale error All zeroes loaded to DAC register ±12 mVGain error ±0.15 %FSRFull-scale error ±0.5 %FSRZero-scale error drift 7 μV/°Cppm ofGain temperature coefficient 3FSR/°CPSRR V = 5V 0.75 mV/VDD(2)OUTPUT CHARACTERISTICSOutput voltage range 2 x V L V H VREF REFOutput voltage settling time R = 2kΩ, 0pF < C < 200pF 5 μsL LSlew rate 1.8 V/μsR = ∞ 470LCapacitive load stability pFR = 2kΩ 1000LDigital-to-analog glitch impulse 1 LSB change around major carry 0.1 nV-sDigital feedthrough 0.1 nV-sOutput noise density 10kHz offset frequency 120 nV/√HzTotal harmonic distortion f = 1kHz, f = 1MSPS, BW = 20kHz –85 dBOUT SDC output impedance 1 ΩV = 5V 50DDShort-circuit current mAV = 3V 20DDComing out of power-down mode, V = 5V 15DDPower-up time μsComing out of power-down mode, V = 3V 15DDREFERENCE INPUTV H Input range 0 V VREF DDV L Input range V L < V H 0 GND V VREF REF REF DDReference input impedance 100 kΩV = V = 5V 50 100REF DDReference current μAV = V = 3V 30 60REF DD(2)LOGIC INPUTSInput current ±1 μAV , Input low voltage IOV ≥ 2.7V 0.3 IOV VIN_L DD DDV , Input high voltage IOV ≥ 2.7V 0.7 IOV VIN_H DD DDPin capacitance 3 pF(1) Linearity tested using a reduced code range of 30 to 4065; output unloaded.(2) Specified by design and characterization; not production tested. For 1.8V < IOV < 2.7V, it is recommended that V ≥ 0.8 IOV , andDD IH DDV ≤ 0.2 IOV .IL DD3Submit Documentation FeedbackDAC7551

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