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BUK752R7-30B |BUK752R730B0523N/a70avaiN-channel TrenchMOS standard level FET


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BUK752R7-30B
N-channel TrenchMOS standard level FET
BUK752R7-30B
N-channel TrenchMOS standard level FET
Rev. 04 — 7 June 2010 Product data sheet Product profile
1.1 General description

Standard level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic
package using TrenchMOS technology. This product has been designed and qualified to
the appropriate AEC standard for use in automotive critical applications.
1.2 Features and benefits
Low conduction losses due to low
on-state resistance Q101 compliant Suitable for standard level gate drive
sources Suitable for thermally demanding
environments due to 175 °C rating
1.3 Applications
12 V loads Automotive systems General purpose power switching Motors, lamps and solenoids
1.4 Quick reference data

[1] Continuous current is limited by package.
Table 1. Quick reference data

VDS drain-source
voltage≥25 °C; Tj≤ 175°C --30 V drain current VGS =10V; Tmb =25°C;
see Figure 1; see Figure 3
[1] --75 A
Ptot total power
dissipation
Tmb=25 °C; see Figure 2 --300 W
Static characteristics

RDSon drain-source
on-state
resistance
VGS =10V; ID =25A; Tj =25°C;
see Figure 11; see Figure 12
-2.3 2.7 mΩ
Avalanche ruggedness

EDS(AL)S non-repetitive
drain-source
avalanche energy =75A; Vsup≤30V;
RGS =50 Ω; VGS =10V;
Tj(init)=25 °C; unclamped
--2.3 J
Dynamic characteristics

QGD gate-drain charge VGS =10V; ID =25 A; VDS =24V; =25°C; see Figure 13
-29 - nC
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET Pinning information
Ordering information
Table 2. Pinning information
G gate
SOT78 (TO-220AB)
D drain source D mounting base; connected to
drain
Table 3. Ordering information

BUK752R7-30B TO-220AB plastic single-ended package; heatsink mounted; 1 mounting
hole; 3-lead TO-220AB
SOT78
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET Limiting values

[1] Current is limited by power dissipation chip rating.
[2] Continuous current is limited by package.
Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).
VDS drain-source voltage Tj≥25 °C; Tj≤ 175°C --30 V
VDGR drain-gate voltage RGS =20kΩ --30 V
VGS gate-source voltage -20 - 20 V drain current Tmb =25°C; VGS =10V; see Figure 1;
see Figure 3
[1] - - 241 A
Tmb =100 °C; VGS=10 V; see Figure 1 [2] --75 A
Tmb =25°C; VGS =10V; see Figure 1;
see Figure 3
[2] --75 A
IDM peak drain current Tmb =25°C; tp≤10 µs; pulsed;
see Figure 3 - 967 A
Ptot total power dissipation Tmb =25°C; see Figure 2 - - 300 W
Tstg storage temperature -55 - 175 °C junction temperature -55 - 175 °C
Source-drain diode
source current Tmb =25°C [1] - - 241 A
[2] --75 A
ISM peak source current tp≤10 µs; pulsed; Tmb=25°C - - 967 A
Avalanche ruggedness

EDS(AL)S non-repetitive
drain-source
avalanche energy =75A; Vsup≤30 V; RGS =50Ω;
VGS =10V; Tj(init)=25 °C; unclamped
--2.3 J
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET Thermal characteristics

Table 5. Thermal characteristics

Rth(j-mb) thermal resistance from
junction to mounting base
see Figure 4 --0.5 K/W
Rth(j-a) thermal resistance from
junction to ambient
vertical in still air - 60 - K/W
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET Characteristics

Table 6. Characteristics
Static characteristics

V(BR)DSS drain-source
breakdown voltage =0.25mA; VGS =0V; Tj=25°C 30 --V =0.25mA; VGS =0V; Tj= -55°C 27 - - V
VGS(th) gate-source threshold
voltage =1mA; VDS =VGS; Tj =25°C;
see Figure 10
234V =1mA; VDS =VGS; Tj= 175 °C;
see Figure 10 --V =1mA; VDS =VGS; Tj =-55 °C;
see Figure 10
--4.4 V
IDSS drain leakage current VDS =30V; VGS =0V; Tj= 175°C - - 500 µA
VDS =30V; VGS =0V; Tj=25°C - 0.02 1 µA
IGSS gate leakage current VDS =0V; VGS =20V; Tj=25°C - 2 100 nA
VDS =0V; VGS =-20 V; Tj=25°C - 2 100 nA
RDSon drain-source on-state
resistance
VGS =10V; ID =25A; Tj= 175 °C;
see Figure 11; see Figure 12
--5.1 mΩ
VGS =10V; ID =25A; Tj =25°C;
see Figure 11; see Figure 12
-2.3 2.7 mΩ
Dynamic characteristics

QG(tot) total gate charge ID =25A; VDS =24V; VGS =10V; =25°C; see Figure 13
-91 - nC
QGS gate-source charge - 19 - nC
QGD gate-drain charge - 29 - nC
Ciss input capacitance VGS =0V; VDS =25V; f=1MHz; =25°C; see Figure 14 4659 6212 pF
Coss output capacitance - 1691 2029 pF
Crss reverse transfer
capacitance 622 852 pF
td(on) turn-on delay time VDS =30V; RL =1.2 Ω; VGS =10V;
RG(ext) =10 Ω; Tj =25°C
-31 - ns rise time - 107 - ns
td(off) turn-off delay time - 113 - ns fall time -118 -ns internal drain
inductance
from drain lead 6 mm from package to
center of die ; Tj =25°C
-4.5 -nH
from contact screw on mounting base to
center of die ; Tj =25°C
-3.5 -nH internal source
inductance
from source lead to source bond pad; =25°C
-7.5 -nH
Source-drain diode

VSD source-drain voltage IS =40A; VGS =0V; Tj =25°C;
see Figure 15 0.85 1.2 V
trr reverse recovery time IS =20A; dIS/dt= -100 A/µs; VGS =-10V;
VDS =20V; Tj =25°C
-88 - ns recovered charge - 132 - nC
NXP Semiconductors BUK752R7-30B
N-channel TrenchMOS standard level FET
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