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BUK6213-30A |BUK621330ANXPN/a10000avaiN-channel TrenchMOS intermediate level FET


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BUK6213-30A
N-channel TrenchMOS intermediate level FET
Product profile1.1 General description
Intermediate level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic
package using TrenchMOS technology. This product has been designed and qualified to
the appropriate AEC standard for use in automotive critical applications.
1.2 Features and benefits
AEC Q101 compliant Suitable for logic or standard level
gate drive sources Suitable for thermally demanding
environments due to 175 °C rating
1.3 Applications
12 V loads Automotive systems General purpose power switching Motors, lamps and solenoids
1.4 Quick reference data

[1] Continuous current is limited by bondwires.
BUK6213-30A
N-channel TrenchMOS intermediate level FET
Rev. 03 — 2 February 2011 Product data sheet
Table 1. Quick reference data

VDS drain-source
voltage≥25 °C; Tj≤ 175°C --30 V drain current VGS =10V; Tmb =25°C;
see Figure 1; see Figure 3
[1] --55 A
Ptot total power
dissipation
Tmb=25 °C; see Figure 2 --102 W
Static characteristics

RDSon drain-source
on-state
resistance
VGS =10V; ID =10A; =25°C; see Figure 4;
see Figure 5 1013mΩ
Avalanche ruggedness

EDS(AL)S non-repetitive
drain-source
avalanche energy =55A; Vsup≤30V;
RGS =50 Ω; VGS =10V;
Tj(init)=25 °C; unclamped
--267 mJ
Dynamic characteristics

QGD gate-drain charge VGS =5V; ID =25A;
VDS =24V
-14 -nC
NXP Semiconductors BUK6213-30A
N-channel TrenchMOS intermediate level FET Pinning information
Ordering information
Table 2. Pinning information
Table 3. Ordering information

BUK6213-30A DPAK plastic single-ended surface-mounted package (DPAK); 3 leads
(one lead cropped)
SOT428
NXP Semiconductors BUK6213-30A
N-channel TrenchMOS intermediate level FET Limiting values

[1] Current is limited by power dissipation chip rating.
[2] Continuous current is limited by bondwires.
Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).
VDS drain-source voltage Tj≥25 °C; Tj≤ 175°C - 30 V
VDGR drain-gate voltage RGS =20kΩ -30 V
VGS gate-source voltage -20 20 V drain current Tmb =100 °C; VGS=10 V; see Figure 1 [1] -45 A
Tmb =25°C; VGS =10V; see Figure 1;
see Figure 3
[2] -55 A
[1] -64 A
IDM peak drain current Tmb=25 °C; pulsed; tp≤10 µs;
see Figure 3 257 A
Ptot total power dissipation Tmb =25°C; see Figure 2 - 102 W
Tstg storage temperature -55 175 °C junction temperature -55 175 °C
Source-drain diode
source current Tmb =25°C [1] -64 A
[2] -55 A
ISM peak source current pulsed; tp≤10 µs; Tmb=25°C - 257 A
Avalanche ruggedness

EDS(AL)S non-repetitive drain-source
avalanche energy =55A; Vsup≤30 V; RGS =50Ω;
VGS =10V; Tj(init)=25 °C; unclamped 267 mJ
NXP Semiconductors BUK6213-30A
N-channel TrenchMOS intermediate level FET Thermal characteristics
Characteristics
Table 5. Thermal characteristics

Rth(j-mb) thermal resistance from junction to mounting base --1.4 K/W
Rth(j-a) thermal resistance from
junction to ambient 71.4 - K/W
Table 6. Characteristics
Static characteristics

V(BR)DSS drain-source
breakdown voltage =0.25mA; VGS =0V; Tj=25°C 30 --V =0.25mA; VGS =0V; Tj= -55°C 27 - - V
VGS(th) gate-source threshold
voltage =1mA; VDS =VGS; Tj =25°C 1 1.8 3 V
VGSth gate-source threshold voltage ID =1mA; VDS =VGS; Tj= -55°C --3.5 V =1mA; VDS =VGS; Tj= 175°C 0.5 - - V
IDSS drain leakage current VDS =30V; VGS =0V; Tj=25°C - 0.05 10 µA
IGSS gate leakage current VGS =20V; VDS =0V; Tj=25°C - 2 100 nA
VGS =-20 V; VDS =0V; Tj=25°C - 2 100 nA
RDSon drain-source on-state resistance VGS =4.5 V; ID=10A - 1520mΩ
VGS =10V; ID =10A; Tj= 175°C - - 25 mΩ
VGS =10V; ID =10A; Tj =25°C;see Figure 4; see Figure 5 - 1013mΩ
NXP Semiconductors BUK6213-30A
N-channel TrenchMOS intermediate level FET

IDSS drain leakage current VDS =30V; VGS =0V; Tj =175 °C;
see Figure 4; see Figure 5 - 500 µA
Dynamic characteristics

QG(tot) total gate charge ID =25A; VDS =24V; VGS =10V - 44 - nC =25A; VDS =24V; VGS =5V - 26 - nC
QGS gate-source charge - 7 - nC
QGD gate-drain charge - 14 - nC
Ciss input capacitance VGS =0V; VDS =25V; f=1MHz; =25°C 1490 1986 pF
Coss output capacitance - 505 606 pF
Crss reverse transfer
capacitance 325 445 pF
td(on) turn-on delay time VDS =25V; RL =1.2 Ω; VGS =10V;
RG(ext) =10Ω
-12 -ns rise time - 95 - ns
td(off) turn-off delay time - 75 - ns fall time - 105 - ns internal drain
inductance
measured from drain to center of die - 2.5 - nH internal source
inductance
measured from source lead to source
bond pad
-7.5 -nH
Source-drain diode

VSD source-drain voltage IS =15A; VGS =0V; Tj=25°C - 0.85 1.2 V
trr reverse recovery time IS =20A; dIS/dt= -100 A/µs;
VGS =-10 V; VDS =25V
-49 -ns recovered charge - 27 - nC
Table 6. Characteristics …continued
NXP Semiconductors BUK6213-30A
N-channel TrenchMOS intermediate level FET Package outline

Fig 6. Package outline SOT428 (DPAK)
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