Partno |
Mfg |
Dc |
Qty |
Available | Descript |
ABT16600 |
TI|Texas Instruments |
N/a |
11 |
|
|
ABT18502 , SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
ABT22V10A7A ,5V high-speed universal PLD device with live insertion capability
ABT22V10A7A ,5V high-speed universal PLD device with live insertion capability
ABT574A , OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS
ABTE16246 , 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVER WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
AD7534JN ,LC2MOS uP-COMPATIBLE 14-BIT DACcharacteristics
over the specified temperature range.
The device is fully protected against C ..
AD7534JN ,LC2MOS uP-COMPATIBLE 14-BIT DACcharacteristics
over the specified temperature range.
The device is fully protected against C ..
AD7534JN ,LC2MOS uP-COMPATIBLE 14-BIT DACFEATURES
" Grade: 16-Bit Monotonie Over the Full Tempora-
tun
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