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74LVC126ADNXPLIPS/TIN/a13368avai74LVC126A; Quad buffer/line driver with 5 Volt tolerant input/outputs; 3-state
74LVC126APWNXPN/a2374avaiQuad buffer/line driver with 5 V tolerant input/outputs; 3-state


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74LVC126AD-74LVC126APW
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
1. General description
The 74LVC126A consists of four non-inverting buffers/line drivers with 3-state outputs,
which are controlled by the output enable input (nOE). A LOW at nOE causes the outputs
to assume a high-impedance OFF-state.
Inputs can be driven from either 3.3 Vor5 V devices. When disabled, up to 5.5 V can be
applied to the outputs.
2. Features and benefits
5 V tolerant inputs/outputs for interfacing with 5 V logic Wide supply voltage range from 1.2 Vto 3.6V CMOS low power consumption Direct interface with TTL levels Complies with JEDEC standard: JESD8-7A (1.65Vto 1.95V) JESD8-5A (2.3Vto 2.7V) JESD8-C/JESD36 (2.7Vto 3.6V) ESD protection: HBM JESD22-A114F exceeds 2000V MM JESD22-A115B exceeds 200V CDM JESD22-C101E exceeds 1000V Specified from 40 C to +85C and 40 C to +125C
3. Ordering information

74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
Rev. 8 — 8 April 2014 Product data sheet
Table 1. Ordering information
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
4. Functional diagram

5. Pinning information
5.1 Pinning

NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
5.2 Pin description

6. Functional description

[1] H = HIGH voltage level
L = LOW voltage level
X = don’t care
Z = high-impedance OFF-state
7. Limiting values

Table 2. Pin description
Table 3. Function selection[1]
Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state

[1] The minimum input voltage ratings may be exceeded if the input current ratings are observed.
[2] The output voltage ratings may be exceeded if the output current ratings are observed.
[3] For SO14 packages: above 70 C the value of Ptot derates linearly with 8 mW/K.
For (T)SSOP14 packages: above 60 C the value of Ptot derates linearly with 5.5 mW/K.
For DHVQFN14 packages: above 60 C the value of Ptot derates linearly with 4.5 mW/K.
8. Recommended operating conditions

9. Static characteristics

Table 4. Limiting values …continued

In accordance with the Absolute Maximum Rating System (IEC 60134).
Table 5. Recommended operating conditions
Table 6. Static characteristics

At recommended operating conditions. Voltages are referenced to GND (ground = 0 V).
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state

[1] All typical values are measured at VCC=3.3 V (unless stated otherwise) and Tamb =25C.
Table 6. Static characteristics …continued

At recommended operating conditions. Voltages are referenced to GND (ground = 0 V).
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
10. Dynamic characteristics

[1] Typical values are measured at Tamb =25 C and VCC = 1.2 V, 1.8 V, 2.5 V, 2.7 V, and 3.3 V respectively.
[2] tpd is the same as tPLH and tPHL.
ten is the same as tPZL and tPZH.
tdis is the same as tPLZ and tPHZ.
[3] Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
[4] CPD is used to determine the dynamic power dissipation (PDin W). =CPD VCC2fi N+ (CL VCC2fo) where: = input frequency in MHz; fo= output frequency in MHz= output load capacitance inpF
VCC= supply voltage in Volts= number of inputs switching
(CL VCC2fo)= sum of the outputs
Table 7. Dynamic characteristics

Voltages are referenced to GND (ground=0 V). For test circuit see Figure8.
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
11. AC waveforms

Table 8. Measurement points
NXP Semiconductors 74L VC126A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state

Table 9. Test data
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