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74ABT16374BDGGPHI N/a1743avai16-bit D-type flip-flop; positive-edge trigger 3-State
74ABT16374BDLPHI N/a1500avai16-bit D-type flip-flop; positive-edge trigger 3-State


74ABT16374BDGG ,16-bit D-type flip-flop; positive-edge trigger 3-StatePIN CONFIGURATION1 481OE 1CP11OE 1EN21Q0 47 1D0481CP C11Q1 3 46 1D1242OE 2ENGND 4 45 GND252CP C21Q2 ..
74ABT16374BDL ,16-bit D-type flip-flop; positive-edge trigger 3-StateINTEGRATED CIRCUITS74ABT16374B74ABTH16374B16-bit D-type flip-flop; positive-edge trigger (3-State)P ..
74ABT16374CMTD ,16-Bit D Flip-Flop with 3-STATE OutputsFeaturesThe ABT16374 contains sixteen non-inverting D-type flip-

74ABT16374BDGG-74ABT16374BDL
16-bit D-type flip-flop; positive-edge trigger 3-State
Product specification
Supersedes data of 1995 Sep 28
IC23 Data Handbook
1998 Feb 27
Philips Semiconductors Product specification
74ABT16374B
74ABTH16374B
16-bit D-type flip-flop; positive-edge trigger
(3-State)
FEATURES
Two 8-bit positive edge triggered registers Live insertion/extraction permitted Power-up 3-State Power-up reset Multiple VCC and GND pins minimize switching noise 3-State output buffers 74ABTH16373B incorporates bus-hold data inputs which
eliminate the need for external pull-up resistors to hold unused
inputs Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs Output capability: +64mA/–32mA Latch-up protection exceeds 500mA per JEDEC Std 17 ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 200V per Machine Model
DESCRIPTION

The 74ABT16374B high-performance BiCMOS device combines
low static and dynamic power dissipation with high speed and high
output drive.
The 74ABT16374B has two 8-bit, edge triggered registers, with each
register coupled to eight 3-State output buffers. The two sections of
each register are controlled independently by the clock (nCP) and
Output Enable (nOE) control gates.
Each register is fully edge triggered. The state of each D input, one
set-up time before the Low-to-High clock transition, is transferred to
the corresponding flip-flop’s Q output.
The 3-State output buffers are designed to drive heavily loaded
3-State buses, MOS memories, or MOS microprocessors. Each
active-Low Output Enable (nOE) controls all eight 3-State buffers for
its register independent of the clock operation.
When nOE is Low, the stored data appears at the outputs for that
register. When nOE is High, the outputs for that register are in the
High-impedance “OFF” state, which means they will neither drive
nor load the bus.
Two options are available, 74ABT16374B which does not have the
bus-hold feature and 74ABTH16374B which incorporates the
bus-hold feature.
QUICK REFERENCE DATA
ORDERING INFORMATION
PIN DESCRIPTION
LOGIC SYMBOL
Philips Semiconductors Product specification
74ABT16374B
74ABTH16374B
16-bit D-type flip-flop; positive-edge trigger
(3-State)
LOGIC SYMBOL (IEEE/IEC)
PIN CONFIGURATION
LOGIC DIAGRAM
Philips Semiconductors Product specification
74ABT16374B
74ABTH16374B
16-bit D-type flip-flop; positive-edge trigger
(3-State)
FUNCTION TABLE
= High voltage level= High voltage level one set-up time prior to the High-to-Low E transition= Low voltage level = Low voltage level one set-up time prior to the High-to-Low E transition
NC= No change= Don’t care= High impedance “off” state= Low-to-High clock transition= Not a Low-to-High clock transition
ABSOLUTE MAXIMUM RATINGS1, 2
NOTES:
Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
Philips Semiconductors Product specification
74ABT16374B
74ABTH16374B
16-bit D-type flip-flop; positive-edge trigger
(3-State)
DC ELECTRICAL CHARACTERISTICS
NOTES:
Not more than one output should be tested at a time, and the duration of the test should not exceed one second. This is the increase in supply current for each input at 3.4V. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power. This parameter is valid for any VCC between 0V and 2.1V with a transition time of up to 10msec. From VCC = 2.1V to VCC = 5V ± 10% a
transition time of up to 100μsec is permitted. Unused pins at VCC or GND. This is the bus hold overdrive current required to force the input to the opposite logic state.
Philips Semiconductors Product specification
74ABT16374B
74ABTH16374B
16-bit D-type flip-flop; positive-edge trigger
(3-State)
AC CHARACTERISTICS

GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω
AC SETUP REQUIREMENTS

GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω
AC WAVEFORMS

VM = 1.5V, VIN = GND to 3.0V
Waveform 1. Propagation Delay, Clock Input to Output, Clock
Pulse Width, and Maximum Clock Frequency
Waveform 2. Data Setup and Hold Times
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