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SN74ACT8997DWTI ?N/a8avaiScan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators


SN74ACT8997DW ,Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSESSCAN-CONTROLLED IEEE STD ..
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SN74ACT8997DW
Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators
Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths toBe Included in a Primary Scan Path Include 8-Bit Programmable Binary Counter
to Count or Initiate Interrupt Signals
Include 4-Bit Identification Bus for
Scan-Path Identification
Inputs Are TTL Compatible EPIC  (Enhanced-Performance Implanted
CMOS) 1-m m Process
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs
description

The ’ACT8997 are members of the Texas
Instruments SCOPE testability integrated-
circuit family. This family of components facilitates
testing of complex circuit-board assemblies.
The ’ACT8997 enhance the scan capability of TI’s
SCOPE family by allowing augmentation of a
system’s primary scan path with secondary scan
paths (SSPs), which can be individually selected
by the ’ACT8997 for inclusion in the primary scan
path. These devices also provide buffering of test
signals to reduce the need for external logic.
By loading the proper values into the instruction
register and data registers, the user can select up
to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any
of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed
between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.
All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit
programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and
output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on
either the rising or falling edge of DCI.
The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.
The SN54ACT8997 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ACT8997 is characterized for operation from 0°C to 70°C.
DTDO1
DTDO2
DTDO3
DTDO4
GND
DTMS1
DTMS2
DTMS3
DTMS4
DTCK
TDO
TMS
TRST
ID1
ID2
ID3
ID4
VCC
DTDI1
DTDI2
DTDI3
DTDI4
TDI
TCK
DTDI3
DTDI4
TDI
TCK
TMS
TDO
DTCK
TRST
MCI
DCI
DCO
MCO
DTDO1
DTDO2
DTDO4
GND
DTMS1DTMS2DTMS3DTMS4
ID1ID2ID3ID4
SN54ACT8997... FK PACKAGE
(TOP VIEW)

DTDO3DTDI1DTDI2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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